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Advances in silica-based glasses for UV and vacuum-UV laser optics

  • Linards Skuja*
  • , Hideo Hosono
  • , Masahiro Hirano
  • , Koichi Kajihara
  • *Corresponding author for this work

Research output: Contribution to journalConference articlepeer-review

14 Citations (Scopus)

Abstract

The origins of pre-existing and laser-induced ultraviolet (UV) and vacuum ultraviolet (VUV) optical absorption in state-of-the-art glassy silicon dioxide and the ways to improve it are reviewed. The main causes of pre-existing absorption in UV/VUV are oxygen vacancies, hydroxyl (silanol) groups, and strained bonds/localized states due to glassy disorder. The main absorption bands induced by UV/VUV excimer lasers are due to oxygen vacancies and due to silicon and oxygen dangling bonds (E'-centers and non-bridging oxygen hole centers, respectively). The optimized glasses are achieved via an intricate balance between a good stoichiometry, use of network modifiers (F or OH) to reduce the number of strained bonds, minimized number of Si-OH-related absorbers and using of interstitial hydrogen for annealing of photoinduced defects. The optimization is different for KrF, ArF or F2 excimer laser energies. The most significant advance to increase VUV transparency and laser toughness is fluorine doping. F-doped ("modified") silica glasses show superior transparency and radiation resistance in VUV region and are suitable for photomask substrates in F2-laser based microlithography or for deep-UV optical fibers.

Original languageEnglish
Pages (from-to)1-14
Number of pages14
JournalProceedings of SPIE - The International Society for Optical Engineering
Volume5122
DOIs
Publication statusPublished - 2002
EventPROCEEDINGS OF SPIE SPIE - The International Society for Optical Engineering: Advanced Organic and Inorganic Optical Materials - Riga, Latvia
Duration: 19 Aug 200222 Aug 2002

Keywords

  • Color centers
  • Excimer lasers
  • Optical materials
  • Photoinduced defects
  • Silica glass
  • UV-photolithography
  • UV-transparency

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