Abstract
Irradiation effects on highly oriented antiferroelectric PbZrO3 and ferroelectric Pb0.92La0.08(Zr0.65Ti0.35) O3 thin films are investigated being exposed to neutron irradiation up to fluence 2*1022 m-2. The higher resistance of antiferroelectric PbZrO3 thin films as compared to ferroelectric heterostructures to large fluences of neutron irradiation is recognized and discussed. Influence of two factors (structural and charge) was taken into account analysing irradiation effects on materials of different polarization states: ferroelectric PLZT (ceramics and thin films) and antiferroelectric PbZrO3 films.
| Original language | English |
|---|---|
| Pages (from-to) | 1653-1657 |
| Number of pages | 5 |
| Journal | Journal of the European Ceramic Society |
| Volume | 24 |
| Issue number | 6 |
| DOIs | |
| Publication status | Published - Jun 2004 |
Keywords
- Antiferroelectric and ferroelectric thin films
- Dielectric properties
- Neutron irradiation
- Oxygen vacancies
- Radiation-induced charges
Fingerprint
Dive into the research topics of 'Antiferroelectric PbZrO3 thin films: Structure, properties and irradiation effects'. Together they form a unique fingerprint.Cite this
- APA
- Author
- BIBTEX
- Harvard
- Standard
- RIS
- Vancouver