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Crystal field analysis of the energy level structure of Cs 2NaAlF6:Cr3+

  • C. Rudowicz*
  • , M. G. Brik
  • , N. M. Avram
  • , Y. Y. Yeung
  • , P. Gnutek
  • *Corresponding author for this work
  • West Pomeranian University of Technology
  • Kyoto University
  • Kwansei Gakuin University
  • West University of Timisoara
  • The Education University of Hong Kong

Research output: Contribution to journalArticlepeer-review

57 Citations (Scopus)

Abstract

An analysis of the energy level structure of Cr3+ ions in Cs2NaAlF6 crystal is performed using the exchange charge model (ECM) together with the crystal field analysis/microscopic spin Hamiltonian (CFA/MSH) computer package. Utilizing the crystal structure data, our approach enables modelling of the crystal field parameters (CFPs) and thus the energy level structure for Cr3+ ions at the two crystallographically inequivalent sites in Cs2NaAlF6. Using the ECM initial adjustment procedure, the CFPs are calculated in the crystallographic axis system centred at the Cr3+ ion at each site. Additionally the CFPs are also calculated using the superposition model (SPM). The ECM and SPM predicted CFP values match very well. Consideration of the symmetry aspects for the so-obtained CFP datasets reveals that the latter axis system matches the symmetry-adapted axis system related directly to the six Cr-F bonds well. Using the ECM predicted CFPs as an input for the CFA/MSH package, the complete energy level schemes are calculated for Cr3+ ions at the two sites. Comparison of the theoretical results with the experimental spectroscopic data yields satisfactory agreement. Our results confirm that the actual symmetry at both impurity sites I and II in the Cs2NaAlF 6:Cr3+ system is trigonal D3d. The ECM predicted CFPs may be used as the initial (starting) parameters for simulations and fittings of the energy levels for Cr3+ ions in structurally similar hosts.

Original languageEnglish
Pages (from-to)5221-5234
Number of pages14
JournalJournal of Physics Condensed Matter
Volume18
Issue number22
DOIs
Publication statusPublished - 7 Jun 2006
Externally publishedYes

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