Abstract
Statistical currents in the n-p-p+ structures, synthesized on the basis of a chromium-compensated silicon-germanium solid solution, have been studied experimentally. The I-V characteristic of such structures was observed to have a section in which the current increases sublinearly with voltage V ≈ V0exp(JaW). The experimental results are explained on the basis of the theory of injection de;etion.
| Original language | English |
|---|---|
| Pages (from-to) | 550-551 |
| Number of pages | 2 |
| Journal | Semiconductors |
| Volume | 30 |
| Issue number | 6 |
| Publication status | Published - Jun 1996 |
| Externally published | Yes |
Fingerprint
Dive into the research topics of 'Current-voltage characteristic of n-p-p+ structures based on a chromium-compensated silicon-germanium solid solution'. Together they form a unique fingerprint.Cite this
- APA
- Author
- BIBTEX
- Harvard
- Standard
- RIS
- Vancouver