Abstract
It is shown in this paper that the microscopic mechanism of the dielectric relaxation in Mn-doped strontium titanate (SrTiO3-ST) ceramics is associated with the off-center displacement of MnSr2 + ions. This was accomplished by studying the dielectric properties and electron spin resonance spectroscopy in combination with X-ray powder diffractometry and scanning electron microscopy techniques in Sr1-xMnxTiO3 ceramic samples sintered in different atmospheres (air, oxygen and nitrogen) at 1500 °C. First, it is shown that manganese is incorporated into the perovskite lattice of ST, preferably as Mn2+ at Sr sites. However, a small amount of Mn4+ at Ti sites is also observed when fired in air or oxygen flow. The concentration of MnTi4 + is the highest for sintering in oxygen, but firing in a reducing atmosphere (nitrogen) results solely in the incorporation of Mn2+ at Sr sites. Correspondingly, the dielectric relaxation observed in Sr1-xMnxTiO3 markedly increases in intensity and slightly shifts towards a higher temperature for ceramics sintered in nitrogen compared with those fired in air or oxygen. All these facts are consistent with a suggestion that the off-center displacement of Mn2+ ions at the Sr sites of the highly polarizable ST lattice is the source of the observed relaxation behavior.
| Original language | English |
|---|---|
| Pages (from-to) | 5385-5391 |
| Number of pages | 7 |
| Journal | Acta Materialia |
| Volume | 54 |
| Issue number | 20 |
| DOIs | |
| Publication status | Published - Dec 2006 |
| Externally published | Yes |
Keywords
- Dielectric properties
- Electroceramics
- Scanning electron microscopy (SEM)
- Sintering
- X-ray diffraction
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