EPR spectrum angular dependences in LiYF4 crystal

A. Antuzevics; A. Fedotovs; U. Rogulis

doi:10.2478/v10047-012-0034-0

EPR spectrum angular dependences in LiYF4 crystal

Laboratory of Spectroscopy, Institute of Solid State Physics

Research output: Contribution to journal › Article › peer-review

2 Citations (Scopus)

Abstract

Electron paramagnetic resonance (EPR) measurements have been made for two perpendicular planes in a LiYF₄ crystal before and after x-ray irradiation at room temperature. Analysis of the EPR spectrum angular dependence shows the presence of two defects - an impurity ion, which was embedded during the crystal growth process, and an x-ray induced defect with the g-factor of approx. 2.0. Spectral parameters and possible defect models are discussed.

Original language	English
Pages (from-to)	49-54
Number of pages	6
Journal	Latvian Journal of Physics and Technical Sciences
Volume	49
Issue number	6-I
DOIs	https://doi.org/10.2478/v10047-012-0034-0
Publication status	Published - Dec 2012

OECD Field of Science

1.3 Physical Sciences

Keywords

EPR spectrum
LiYF crystal

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10.2478/v10047-012-0034-0

Cite this

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title = "EPR spectrum angular dependences in LiYF4 crystal",

abstract = "Electron paramagnetic resonance (EPR) measurements have been made for two perpendicular planes in a LiYF4 crystal before and after x-ray irradiation at room temperature. Analysis of the EPR spectrum angular dependence shows the presence of two defects - an impurity ion, which was embedded during the crystal growth process, and an x-ray induced defect with the g-factor of approx. 2.0. Spectral parameters and possible defect models are discussed.",

keywords = "EPR spectrum, LiYF crystal",

author = "A. Antuzevics and A. Fedotovs and U. Rogulis",

year = "2012",

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doi = "10.2478/v10047-012-0034-0",

language = "English",

volume = "49",

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T1 - EPR spectrum angular dependences in LiYF4 crystal

AU - Antuzevics, A.

AU - Fedotovs, A.

AU - Rogulis, U.

PY - 2012/12

Y1 - 2012/12

N2 - Electron paramagnetic resonance (EPR) measurements have been made for two perpendicular planes in a LiYF4 crystal before and after x-ray irradiation at room temperature. Analysis of the EPR spectrum angular dependence shows the presence of two defects - an impurity ion, which was embedded during the crystal growth process, and an x-ray induced defect with the g-factor of approx. 2.0. Spectral parameters and possible defect models are discussed.

AB - Electron paramagnetic resonance (EPR) measurements have been made for two perpendicular planes in a LiYF4 crystal before and after x-ray irradiation at room temperature. Analysis of the EPR spectrum angular dependence shows the presence of two defects - an impurity ion, which was embedded during the crystal growth process, and an x-ray induced defect with the g-factor of approx. 2.0. Spectral parameters and possible defect models are discussed.

KW - EPR spectrum

KW - LiYF crystal

UR - https://www.scopus.com/pages/publications/84878308531

U2 - 10.2478/v10047-012-0034-0

DO - 10.2478/v10047-012-0034-0

M3 - Article

AN - SCOPUS:84878308531

SN - 0868-8257

VL - 49

SP - 49

EP - 54

JO - Latvian Journal of Physics and Technical Sciences

JF - Latvian Journal of Physics and Technical Sciences

IS - 6-I

ER -

EPR spectrum angular dependences in LiYF4 crystal

Abstract

OECD Field of Science

Keywords

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