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EXAFS and XRD studies with subpicometer accuracy: The case of ReO 3

  • Juris Purans*
  • , Giuseppe Dalba
  • , Paolo Fornasini
  • , Alexei Kuzmin
  • , Simone De Panfilis
  • , Francesco Rocca
  • *Corresponding author for this work
  • University of Trento
  • European Synchrotron Radiation Facility
  • National Research Council of Italy

Research output: Chapter in Book/Report/Conference proceedingConference paperResearchpeer-review

12 Citations (Scopus)

Abstract

EXAFS has been measured on ReO3 from 30 to 600 K; XRD has been contemporarily measured above 300 K. In this way, it has been possible to compare the expansion of the lattice parameter (XRD) and of the bond lengths (EXAFS), measured at the same time. EXAFS was interpreted by the cumulant approach, using ReO3 measured at low temperature as reference. According to our results, ReO3 shows a complicated behavior of thermal expansion: (i) ultra low or negative expansion below 100 K, (ii) moderate positive expansion above 150 K up to 500 K, (iii) negative expansion from 500K. up to the decomposition temperature. The EXAFS parallel and perpendicular MSRD (mean square relative displacements) have been calculated for the 1st and 4th shells. An unexpected result is that the perpendicular MSRD of the first coordination shell has a weak temperature dependence.

Original languageEnglish
Title of host publicationX-RAY ABSORPTION FINE STRUCTURE - XAFS13
Subtitle of host publication13th International Conference
Pages422-424
Number of pages3
DOIs
Publication statusPublished - 2007
EventX-RAY ABSORPTION FINE STRUCTURE - XAFS13: 13th International Conference - Stanford, CA, United States
Duration: 9 Jul 200614 Jul 2006

Publication series

NameAIP Conference Proceedings
Volume882
ISSN (Print)0094-243X
ISSN (Electronic)1551-7616

Conference

ConferenceX-RAY ABSORPTION FINE STRUCTURE - XAFS13: 13th International Conference
Country/TerritoryUnited States
CityStanford, CA
Period9/07/0614/07/06

Keywords

  • Cumulants
  • EXAFS
  • Re0
  • Thermal expansion
  • XRD

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