Skip to main navigation Skip to search Skip to main content

EXAFS study of mixed nickel molybdenum oxide thin films at the Ni and Mo K-edges

Research output: Contribution to journalConference articlepeer-review

7 Citations (Scopus)

Abstract

Mixed nickel molybdenum oxide thin films were produced by DC magnetron co-sputtering technique with the nickel content about 8, 16 and 25at%. X-ray absorption spectroscopy at the Ni and Mo K-edges was used to study the local atomic structure in the films. The best-fit analysis of the EXAFS signals suggests that (i) the films are amorphous, except for the highest nickel content (25at%), at which a segregation of NiO phase was observed; (ii) nickel and molybdenum atoms are octahedrally coordinated by oxygen atoms. Opposite to the NiO6 octahedra, the MoO6 octahedra are strongly distorted, that results in an existence of two groups of oxygen atoms - four nearest at ∼1.76Å and two distant at ∼2.2Å. It was also found that the MoO6 octahedra are joined by edges, with the Mo-Mo distance about 3.26-3.31Å.

Original languageEnglish
Pages (from-to)321-326
Number of pages6
JournalNuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
Volume531
Issue number1-2
DOIs
Publication statusPublished - 21 Sept 2004
EventProceedings of the 5th International Worshop on Radiation - Riga, Latvia
Duration: 7 Sept 200311 Sept 2003

Keywords

  • EXAFS
  • Mo K-edge
  • Ni K-edge
  • Nickel molybdenum oxide thin film

Fingerprint

Dive into the research topics of 'EXAFS study of mixed nickel molybdenum oxide thin films at the Ni and Mo K-edges'. Together they form a unique fingerprint.

Cite this