Abstract
An attempt is made to interpret the current-voltage characteristic of a p-Si-n-3C-SiC heterostructure in terms of the excess-tunneling mechanism. The space charge region width W and tunneling length λ are estimated. It is shown that W ≫ λ and, despite this, that the current transport through the heterostructure obeys the tunneling mechanism. The characteristic tunneling energy ε = 57 meV, temperature coefficient of the saturation current, and the barrier thinness factor are found.
| Original language | English |
|---|---|
| Pages (from-to) | 77-79 |
| Number of pages | 3 |
| Journal | Semiconductors |
| Volume | 35 |
| Issue number | 1 |
| DOIs | |
| Publication status | Published - Jan 2001 |
| Externally published | Yes |
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