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Excess tunneling currents in p-Si-n-3C-SiC heterostructures

  • S. Zh Karazhanov*
  • , I. G. Atabaev
  • , T. M. Saliev
  • , É V. Kanaki
  • , E. Dzhaksimov
  • *Corresponding author for this work
  • Academy of Sciences of the Republic of Uzbekistan

Research output: Contribution to journalArticlepeer-review

6 Citations (Scopus)

Abstract

An attempt is made to interpret the current-voltage characteristic of a p-Si-n-3C-SiC heterostructure in terms of the excess-tunneling mechanism. The space charge region width W and tunneling length λ are estimated. It is shown that W ≫ λ and, despite this, that the current transport through the heterostructure obeys the tunneling mechanism. The characteristic tunneling energy ε = 57 meV, temperature coefficient of the saturation current, and the barrier thinness factor are found.

Original languageEnglish
Pages (from-to)77-79
Number of pages3
JournalSemiconductors
Volume35
Issue number1
DOIs
Publication statusPublished - Jan 2001
Externally publishedYes

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