Fatigue of piezoelectric properties in Pb(Zr,Ti)O3 films

A. L. Kholkin; E. L. Colla; A. K. Tagantsev; D. V. Taylor; N. Setter

doi:10.1063/1.116189

Fatigue of piezoelectric properties in Pb(Zr,Ti)O3 films

A. L. Kholkin^*
, E. L. Colla
, A. K. Tagantsev
, D. V. Taylor
, N. Setter

^*Corresponding author for this work

Swiss Federal Institute of Technology Lausanne

Research output: Contribution to journal › Article › peer-review

129 Citations (Scopus)

Abstract

Piezoelectric properties of Pb(Zr,Ti)O3 thin films are investigated as a function of the number of bipolar (switching) and unipolar (nonswitching) voltage pulses. The longitudinal piezoelectric coefficient d33 decreases with bipolar fatigue reflecting the decrease of switchable polarization. Simultaneously, a strong vertical shift of piezoelectric hysteresis loops is observed, which is considered as the buildup of fixed internal polarization due to the pinning of ferroelectric domains in a preferred orientation. Piezoelectric fatigue induced by unipolar (nonswitching) pulses is considerably smaller than the fatigue under bipolar conditions and can be described by the internal bias field which shifts piezoelectric hysteresis loops along the field axis.

Original language	English
Pages (from-to)	2577-2579
Number of pages	3
Journal	Applied Physics Letters
Volume	68
Issue number	18
DOIs	https://doi.org/10.1063/1.116189
Publication status	Published - 1996
Externally published	Yes

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title = "Fatigue of piezoelectric properties in Pb(Zr,Ti)O3 films",

abstract = "Piezoelectric properties of Pb(Zr,Ti)O3 thin films are investigated as a function of the number of bipolar (switching) and unipolar (nonswitching) voltage pulses. The longitudinal piezoelectric coefficient d33 decreases with bipolar fatigue reflecting the decrease of switchable polarization. Simultaneously, a strong vertical shift of piezoelectric hysteresis loops is observed, which is considered as the buildup of fixed internal polarization due to the pinning of ferroelectric domains in a preferred orientation. Piezoelectric fatigue induced by unipolar (nonswitching) pulses is considerably smaller than the fatigue under bipolar conditions and can be described by the internal bias field which shifts piezoelectric hysteresis loops along the field axis.",

author = "Kholkin, \{A. L.\} and Colla, \{E. L.\} and Tagantsev, \{A. K.\} and Taylor, \{D. V.\} and N. Setter",

year = "1996",

doi = "10.1063/1.116189",

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T1 - Fatigue of piezoelectric properties in Pb(Zr,Ti)O3 films

AU - Kholkin, A. L.

AU - Colla, E. L.

AU - Tagantsev, A. K.

AU - Taylor, D. V.

AU - Setter, N.

PY - 1996

Y1 - 1996

N2 - Piezoelectric properties of Pb(Zr,Ti)O3 thin films are investigated as a function of the number of bipolar (switching) and unipolar (nonswitching) voltage pulses. The longitudinal piezoelectric coefficient d33 decreases with bipolar fatigue reflecting the decrease of switchable polarization. Simultaneously, a strong vertical shift of piezoelectric hysteresis loops is observed, which is considered as the buildup of fixed internal polarization due to the pinning of ferroelectric domains in a preferred orientation. Piezoelectric fatigue induced by unipolar (nonswitching) pulses is considerably smaller than the fatigue under bipolar conditions and can be described by the internal bias field which shifts piezoelectric hysteresis loops along the field axis.

AB - Piezoelectric properties of Pb(Zr,Ti)O3 thin films are investigated as a function of the number of bipolar (switching) and unipolar (nonswitching) voltage pulses. The longitudinal piezoelectric coefficient d33 decreases with bipolar fatigue reflecting the decrease of switchable polarization. Simultaneously, a strong vertical shift of piezoelectric hysteresis loops is observed, which is considered as the buildup of fixed internal polarization due to the pinning of ferroelectric domains in a preferred orientation. Piezoelectric fatigue induced by unipolar (nonswitching) pulses is considerably smaller than the fatigue under bipolar conditions and can be described by the internal bias field which shifts piezoelectric hysteresis loops along the field axis.

UR - https://www.scopus.com/pages/publications/0000443350

U2 - 10.1063/1.116189

DO - 10.1063/1.116189

M3 - Article

AN - SCOPUS:0000443350

SN - 0003-6951

VL - 68

SP - 2577

EP - 2579

JO - Applied Physics Letters

JF - Applied Physics Letters

IS - 18

ER -

Fatigue of piezoelectric properties in Pb(Zr,Ti)O3 films

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