Frequency-dependent electromechanical response in ferroelectric materials measured via piezoresponse force microscopy

I. K. Bdikin; V. V. Shvartsman; S. H. Kim; J. Manuel Herrero; A. L. Kholkin

doi:10.1557/proc-784-c11.3

Frequency-dependent electromechanical response in ferroelectric materials measured via piezoresponse force microscopy

I. K. Bdikin^*
, V. V. Shvartsman
, S. H. Kim
, J. Manuel Herrero
, A. L. Kholkin

^*Corresponding author for this work

University of Aveiro
INOSTEK Inc.
ICMM CSIC

Research output: Contribution to journal › Conference article › peer-review

6 Citations (Scopus)

Abstract

Local piezoelectric signal is measured via Piezoresponse Force Microscopy (PFM) in PbZr_0.3Ti_0.7O₃ films and PbZr _1/3Nb_2/3O₃-0.045PbTiO₃ single crystals. It is observed that the amplitude of piezoelectric response is almost independent on frequency for vertical (out of plane) signal and strongly decreases with increasing frequency in the range 10-100 kHz for lateral (in-plane) response. Moreover, the in-plane piezoelectric contrast is reversed when the measurements are done at high enough frequency (phase shift exceeds 90°). As a result, the inplane polarization direction can be misinterpreted if the driving frequency exceeds certain level. For the explanation of observed effect a simple model is proposed that takes into account a possible slip between the conductive PFM tip and moving piezoelectric surface. The implications of the observed frequency-dependent contrast for the domain imaging in ferroelectric materials are discussed.

Original language	English
Pages (from-to)	83-88
Number of pages	6
Journal	Materials Research Society Symposium - Proceedings
Volume	784
DOIs	https://doi.org/10.1557/proc-784-c11.3
Publication status	Published - 2003
Externally published	Yes
Event	Ferroelectric Thin Films XII - Boston, MA, United States Duration: 1 Dec 2003 → 4 Dec 2003

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Cite this

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title = "Frequency-dependent electromechanical response in ferroelectric materials measured via piezoresponse force microscopy",

abstract = "Local piezoelectric signal is measured via Piezoresponse Force Microscopy (PFM) in PbZr0.3Ti0.7O3 films and PbZr 1/3Nb2/3O3-0.045PbTiO3 single crystals. It is observed that the amplitude of piezoelectric response is almost independent on frequency for vertical (out of plane) signal and strongly decreases with increasing frequency in the range 10-100 kHz for lateral (in-plane) response. Moreover, the in-plane piezoelectric contrast is reversed when the measurements are done at high enough frequency (phase shift exceeds 90°). As a result, the inplane polarization direction can be misinterpreted if the driving frequency exceeds certain level. For the explanation of observed effect a simple model is proposed that takes into account a possible slip between the conductive PFM tip and moving piezoelectric surface. The implications of the observed frequency-dependent contrast for the domain imaging in ferroelectric materials are discussed.",

author = "Bdikin, \{I. K.\} and Shvartsman, \{V. V.\} and Kim, \{S. H.\} and Herrero, \{J. Manuel\} and Kholkin, \{A. L.\}",

year = "2003",

doi = "10.1557/proc-784-c11.3",

language = "English",

volume = "784",

pages = "83--88",

journal = "Materials Research Society Symposium - Proceedings",

issn = "0272-9172",

publisher = "Springer Nature",

note = "Ferroelectric Thin Films XII ; Conference date: 01-12-2003 Through 04-12-2003",

}

TY - JOUR

T1 - Frequency-dependent electromechanical response in ferroelectric materials measured via piezoresponse force microscopy

AU - Bdikin, I. K.

AU - Shvartsman, V. V.

AU - Kim, S. H.

AU - Herrero, J. Manuel

AU - Kholkin, A. L.

PY - 2003

Y1 - 2003

N2 - Local piezoelectric signal is measured via Piezoresponse Force Microscopy (PFM) in PbZr0.3Ti0.7O3 films and PbZr 1/3Nb2/3O3-0.045PbTiO3 single crystals. It is observed that the amplitude of piezoelectric response is almost independent on frequency for vertical (out of plane) signal and strongly decreases with increasing frequency in the range 10-100 kHz for lateral (in-plane) response. Moreover, the in-plane piezoelectric contrast is reversed when the measurements are done at high enough frequency (phase shift exceeds 90°). As a result, the inplane polarization direction can be misinterpreted if the driving frequency exceeds certain level. For the explanation of observed effect a simple model is proposed that takes into account a possible slip between the conductive PFM tip and moving piezoelectric surface. The implications of the observed frequency-dependent contrast for the domain imaging in ferroelectric materials are discussed.

AB - Local piezoelectric signal is measured via Piezoresponse Force Microscopy (PFM) in PbZr0.3Ti0.7O3 films and PbZr 1/3Nb2/3O3-0.045PbTiO3 single crystals. It is observed that the amplitude of piezoelectric response is almost independent on frequency for vertical (out of plane) signal and strongly decreases with increasing frequency in the range 10-100 kHz for lateral (in-plane) response. Moreover, the in-plane piezoelectric contrast is reversed when the measurements are done at high enough frequency (phase shift exceeds 90°). As a result, the inplane polarization direction can be misinterpreted if the driving frequency exceeds certain level. For the explanation of observed effect a simple model is proposed that takes into account a possible slip between the conductive PFM tip and moving piezoelectric surface. The implications of the observed frequency-dependent contrast for the domain imaging in ferroelectric materials are discussed.

UR - https://www.scopus.com/pages/publications/2942640261

U2 - 10.1557/proc-784-c11.3

DO - 10.1557/proc-784-c11.3

M3 - Conference article

AN - SCOPUS:2942640261

SN - 0272-9172

VL - 784

SP - 83

EP - 88

JO - Materials Research Society Symposium - Proceedings

JF - Materials Research Society Symposium - Proceedings

T2 - Ferroelectric Thin Films XII

Y2 - 1 December 2003 through 4 December 2003

ER -

Frequency-dependent electromechanical response in ferroelectric materials measured via piezoresponse force microscopy

Abstract

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