Impact of crystallisation processes on depth profile formation in sol-gel PbZr0·52Ti0·48O3 thin films

I. Aulika; S. Mergen; A. Bencan; Q. Zhang; A. Dejneka; M. Kosec; K. Kundzins; D. Demarchi; P. Civera

doi:10.1179/1743676112Y.0000000019

Impact of crystallisation processes on depth profile formation in sol-gel PbZr_0·52Ti_0·48O₃ thin films

I. Aulika^*
, S. Mergen
, A. Bencan
, Q. Zhang
, A. Dejneka
, M. Kosec
, K. Kundzins
, D. Demarchi
, P. Civera

^*Corresponding author for this work

Thin Films Laboratory, Institute of Solid State Physics

Eltek Group
University of Melbourne
J. Stefan Institute
Cranfield University
Czech Academy of Sciences
Italian Institute of Technology
Polytechnic University of Turin

Research output: Contribution to journal › Article › peer-review

2 Citations (Scopus)

Abstract

This study revealed the influence of crystallisation processes on the homogeneity of the sol-gel PbZr_0·52Ti _0·48O₃ thin films, allowing identification and further optimisation of thin film performance. Crystallisation processes determine the optical gradient appearance, irrespective of the chemical solvents used in this work. X-ray diffraction analysis showed that a refractive index gradient was apparent in the samples which had dominant (001)/(100) orientation and significant change of lattice parameters with thickness.

Original language	English
Pages (from-to)	53-58
Number of pages	6
Journal	Advances in Applied Ceramics
Volume	112
Issue number	1
DOIs	https://doi.org/10.1179/1743676112Y.0000000019
Publication status	Published - Jan 2013

Keywords

Compositional and optical gradient
Crystallisation process
Depth profile
PZT
Sol-gel
Spectroscopic ellipsometry
Thin films
XRD

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abstract = "This study revealed the influence of crystallisation processes on the homogeneity of the sol-gel PbZr0·52Ti 0·48O3 thin films, allowing identification and further optimisation of thin film performance. Crystallisation processes determine the optical gradient appearance, irrespective of the chemical solvents used in this work. X-ray diffraction analysis showed that a refractive index gradient was apparent in the samples which had dominant (001)/(100) orientation and significant change of lattice parameters with thickness.",

keywords = "Compositional and optical gradient, Crystallisation process, Depth profile, PZT, Sol-gel, Spectroscopic ellipsometry, Thin films, XRD",

author = "I. Aulika and S. Mergen and A. Bencan and Q. Zhang and A. Dejneka and M. Kosec and K. Kundzins and D. Demarchi and P. Civera",

year = "2013",

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doi = "10.1179/1743676112Y.0000000019",

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T1 - Impact of crystallisation processes on depth profile formation in sol-gel PbZr0·52Ti0·48O3 thin films

AU - Aulika, I.

AU - Mergen, S.

AU - Bencan, A.

AU - Zhang, Q.

AU - Dejneka, A.

AU - Kosec, M.

AU - Kundzins, K.

AU - Demarchi, D.

AU - Civera, P.

PY - 2013/1

Y1 - 2013/1

N2 - This study revealed the influence of crystallisation processes on the homogeneity of the sol-gel PbZr0·52Ti 0·48O3 thin films, allowing identification and further optimisation of thin film performance. Crystallisation processes determine the optical gradient appearance, irrespective of the chemical solvents used in this work. X-ray diffraction analysis showed that a refractive index gradient was apparent in the samples which had dominant (001)/(100) orientation and significant change of lattice parameters with thickness.

AB - This study revealed the influence of crystallisation processes on the homogeneity of the sol-gel PbZr0·52Ti 0·48O3 thin films, allowing identification and further optimisation of thin film performance. Crystallisation processes determine the optical gradient appearance, irrespective of the chemical solvents used in this work. X-ray diffraction analysis showed that a refractive index gradient was apparent in the samples which had dominant (001)/(100) orientation and significant change of lattice parameters with thickness.

KW - Compositional and optical gradient

KW - Crystallisation process

KW - Depth profile

KW - PZT

KW - Sol-gel

KW - Spectroscopic ellipsometry

KW - Thin films

KW - XRD

UR - https://www.scopus.com/pages/publications/84874081367

U2 - 10.1179/1743676112Y.0000000019

DO - 10.1179/1743676112Y.0000000019

M3 - Article

AN - SCOPUS:84874081367

SN - 1743-6753

VL - 112

SP - 53

EP - 58

JO - Advances in Applied Ceramics

JF - Advances in Applied Ceramics

IS - 1

ER -

Impact of crystallisation processes on depth profile formation in sol-gel PbZr_0·52Ti_0·48O₃ thin films

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Keywords

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