Abstract
Electrical and optical properties of H doped ZnO films have been studied experimentally for different H concentrations before and after annealing, as well as theoretically by first-principles calculations. It is found that electrical resistivity of the H doped ZnO increases when increasing the substrate temperature in the range 25-300°C. Carrier concentration and mobility measured by Hall method in as-grown samples are larger than those of annealed ones. The short-wavelength edge of the transmission spectrum of annealed ZnO is found to shift toward lower energies compared to as-grown samples. The band gap estimated from the measured transmission spectra of as grown ZnO increases with increasing H concentration, thus demonstrating the Burstein-Moss effect. However, it decreases in samples annealed at 300°C showing suppression of the Burstein-Moss effect. Possible defect models explaining the reason for the suppression are discussed. The results can be explained by formation of H2 molecules in annealed ZnO.
| Original language | English |
|---|---|
| Pages (from-to) | 1702-1707 |
| Number of pages | 6 |
| Journal | Physica Status Solidi (B): Basic Research |
| Volume | 248 |
| Issue number | 7 |
| DOIs | |
| Publication status | Published - Jul 2011 |
| Externally published | Yes |
Keywords
- Burstein-Moss effect
- Doping
- Hydrogen
- ZnO
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