Investigation of TiO2 ceramic surface conductivity using conductive atomic force microscopy

Kristaps Rubenis; Karlis Kundzins; Janis Locs; Jurijs Ozolins

doi:10.4028/www.scientific.net/KEM.527.154

Investigation of TiO₂ ceramic surface conductivity using conductive atomic force microscopy

Kristaps Rubenis^*
, Karlis Kundzins
, Janis Locs
, Jurijs Ozolins

^*Corresponding author for this work

Thin Films Laboratory, Institute of Solid State Physics

Riga Technical University

Research output: Contribution to journal › Conference article › peer-review

3 Citations (Scopus)

Abstract

Dense TiO₂ (rutile) ceramic samples were prepared by sintering compacts of titanium dioxide anatase powder at 1500 °C for 5h. Sintered samples were polished and annealed in vacuum at 1000 °C for 1h. Structural properties of the samples were studied by X-ray diffraction, polarized light and scanning electron microscopy. The surface topography and local electrical conductivity of the samples were investigated by atomic force microscopy technique under atmospheric conditions. Enhanced electrical conductivity was observed at grain boundaries while the polished, vacuum annealed grains surface showed non-homogeneous conductivity.

Original language	English
Pages (from-to)	154-158
Number of pages	5
Journal	Key Engineering Materials
Volume	527
DOIs	https://doi.org/10.4028/www.scientific.net/KEM.527.154
Publication status	Published - 2012
Event	21st International Baltic Conference on Engineering Materials and Tribology, BALTMATTRIB 2012 - Tallinn, Estonia Duration: 18 Oct 2012 → 19 Oct 2012

Keywords

Atomic force microscopy
Ceramic
Electrical conductivity
Microstructure

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10.4028/www.scientific.net/KEM.527.154

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title = "Investigation of TiO2 ceramic surface conductivity using conductive atomic force microscopy",

abstract = "Dense TiO2 (rutile) ceramic samples were prepared by sintering compacts of titanium dioxide anatase powder at 1500 °C for 5h. Sintered samples were polished and annealed in vacuum at 1000 °C for 1h. Structural properties of the samples were studied by X-ray diffraction, polarized light and scanning electron microscopy. The surface topography and local electrical conductivity of the samples were investigated by atomic force microscopy technique under atmospheric conditions. Enhanced electrical conductivity was observed at grain boundaries while the polished, vacuum annealed grains surface showed non-homogeneous conductivity.",

keywords = "Atomic force microscopy, Ceramic, Electrical conductivity, Microstructure",

author = "Kristaps Rubenis and Karlis Kundzins and Janis Locs and Jurijs Ozolins",

year = "2012",

doi = "10.4028/www.scientific.net/KEM.527.154",

language = "English",

volume = "527",

pages = "154--158",

journal = "Key Engineering Materials",

issn = "1013-9826",

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note = "21st International Baltic Conference on Engineering Materials and Tribology, BALTMATTRIB 2012 ; Conference date: 18-10-2012 Through 19-10-2012",

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TY - JOUR

T1 - Investigation of TiO2 ceramic surface conductivity using conductive atomic force microscopy

AU - Rubenis, Kristaps

AU - Kundzins, Karlis

AU - Locs, Janis

AU - Ozolins, Jurijs

PY - 2012

Y1 - 2012

N2 - Dense TiO2 (rutile) ceramic samples were prepared by sintering compacts of titanium dioxide anatase powder at 1500 °C for 5h. Sintered samples were polished and annealed in vacuum at 1000 °C for 1h. Structural properties of the samples were studied by X-ray diffraction, polarized light and scanning electron microscopy. The surface topography and local electrical conductivity of the samples were investigated by atomic force microscopy technique under atmospheric conditions. Enhanced electrical conductivity was observed at grain boundaries while the polished, vacuum annealed grains surface showed non-homogeneous conductivity.

AB - Dense TiO2 (rutile) ceramic samples were prepared by sintering compacts of titanium dioxide anatase powder at 1500 °C for 5h. Sintered samples were polished and annealed in vacuum at 1000 °C for 1h. Structural properties of the samples were studied by X-ray diffraction, polarized light and scanning electron microscopy. The surface topography and local electrical conductivity of the samples were investigated by atomic force microscopy technique under atmospheric conditions. Enhanced electrical conductivity was observed at grain boundaries while the polished, vacuum annealed grains surface showed non-homogeneous conductivity.

KW - Atomic force microscopy

KW - Ceramic

KW - Electrical conductivity

KW - Microstructure

UR - https://www.scopus.com/pages/publications/84870886020

U2 - 10.4028/www.scientific.net/KEM.527.154

DO - 10.4028/www.scientific.net/KEM.527.154

M3 - Conference article

AN - SCOPUS:84870886020

SN - 1013-9826

VL - 527

SP - 154

EP - 158

JO - Key Engineering Materials

JF - Key Engineering Materials

T2 - 21st International Baltic Conference on Engineering Materials and Tribology, BALTMATTRIB 2012

Y2 - 18 October 2012 through 19 October 2012

ER -

Investigation of TiO₂ ceramic surface conductivity using conductive atomic force microscopy

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Keywords

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