Skip to main navigation Skip to search Skip to main content

Luminescence decay kinetics of Ge related center in silica

  • A. Trukhin*
  • , B. Poumellec
  • , J. Garapon
  • *Corresponding author for this work
  • Université Paris-Saclay

Research output: Contribution to journalConference articlepeer-review

7 Citations (Scopus)

Abstract

Detailed measurements of luminescence decay kinetics in Ge doped silica fiber have been carried out for different excitation energies from 3 to 7.7 eV and luminescence detection energy from 2 to 4 eV. The decay kinetics of luminescence is rather well approximated by an exponent. A distribution of time constants over the range 90-130 μs in decay exponential approximation is pointed out. This distribution is due to structural non-equivalency of Ge centers in the disordered glass structure. At 10 K the life time increases up to 150-450 μs, and it is explained as influence of zero-field splitting of the triplet state. The spectra of luminescence and its excitation also are affected by inhomogeneous broadening. The excitation with photons above 6.4 eV causes appearance of thermally stimulated luminescence also.

Original languageEnglish
Pages (from-to)89-95
Number of pages7
JournalRadiation Effects and Defects in Solids
Volume149
Issue number1 -4 pt 1
DOIs
Publication statusPublished - 1999
EventProceedings of the 1998 8th Europhysical Conference on Defects in Insulating Materials, EURODIM 98 - Keele, UK
Duration: 6 Jun 199811 Jun 1998

Fingerprint

Dive into the research topics of 'Luminescence decay kinetics of Ge related center in silica'. Together they form a unique fingerprint.

Cite this