Measurements of SiO2 glass surface parameters by methods of microscopy

Eduards Gavars; Anda Svagere; Atis Skudra; Natalia Zorina; Raimonds Poplausks

doi:10.1088/1757-899X/38/1/012043

Measurements of SiO₂ glass surface parameters by methods of microscopy

Eduards Gavars
, Anda Svagere^*
, Atis Skudra
, Natalia Zorina
, Raimonds Poplausks

^*Corresponding author for this work

Research output: Contribution to journal › Conference article › peer-review

1 Citation (Scopus)

Abstract

In this research we compare chemical and plasma treatment methods for surface of SiO₂ glass. For chemical treatment of surface tequila and alcohol were used but for plasma treatment - Ar+As and Ar+Se plasmas. Surface topography was analyzed using atomic force microscope. Comparison of chemical and plasma treatment methods shows that surface treated with plasma is smoother. Because of their various chemical compositions tequila and alcohol show different results.

Original language	English
Article number	012043
Journal	IOP Conference Series: Materials Science and Engineering
Volume	38
Issue number	1
DOIs	https://doi.org/10.1088/1757-899X/38/1/012043
Publication status	Published - 2012
Event	International Conference on Functional Materials and Nanotechnologies, FM and NT 2012 - Riga, Latvia Duration: 17 Apr 2012 → 20 Apr 2012

OECD Field of Science

1.3 Physical Sciences
2.5 Materials Engineering

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10.1088/1757-899X/38/1/012043

Cite this

@article{624c578b2c0b411899c414f74ce1a02d,

title = "Measurements of SiO2 glass surface parameters by methods of microscopy",

abstract = "In this research we compare chemical and plasma treatment methods for surface of SiO2 glass. For chemical treatment of surface tequila and alcohol were used but for plasma treatment - Ar+As and Ar+Se plasmas. Surface topography was analyzed using atomic force microscope. Comparison of chemical and plasma treatment methods shows that surface treated with plasma is smoother. Because of their various chemical compositions tequila and alcohol show different results.",

author = "Eduards Gavars and Anda Svagere and Atis Skudra and Natalia Zorina and Raimonds Poplausks",

year = "2012",

doi = "10.1088/1757-899X/38/1/012043",

language = "English",

volume = "38",

journal = "IOP Conference Series: Materials Science and Engineering",

issn = "1757-8981",

publisher = "Institute of Physics",

number = "1",

note = "International Conference on Functional Materials and Nanotechnologies, FM and NT 2012 ; Conference date: 17-04-2012 Through 20-04-2012",

}

TY - JOUR

T1 - Measurements of SiO2 glass surface parameters by methods of microscopy

AU - Gavars, Eduards

AU - Svagere, Anda

AU - Skudra, Atis

AU - Zorina, Natalia

AU - Poplausks, Raimonds

PY - 2012

Y1 - 2012

N2 - In this research we compare chemical and plasma treatment methods for surface of SiO2 glass. For chemical treatment of surface tequila and alcohol were used but for plasma treatment - Ar+As and Ar+Se plasmas. Surface topography was analyzed using atomic force microscope. Comparison of chemical and plasma treatment methods shows that surface treated with plasma is smoother. Because of their various chemical compositions tequila and alcohol show different results.

AB - In this research we compare chemical and plasma treatment methods for surface of SiO2 glass. For chemical treatment of surface tequila and alcohol were used but for plasma treatment - Ar+As and Ar+Se plasmas. Surface topography was analyzed using atomic force microscope. Comparison of chemical and plasma treatment methods shows that surface treated with plasma is smoother. Because of their various chemical compositions tequila and alcohol show different results.

UR - https://www.scopus.com/pages/publications/84874038475

U2 - 10.1088/1757-899X/38/1/012043

DO - 10.1088/1757-899X/38/1/012043

M3 - Conference article

AN - SCOPUS:84874038475

SN - 1757-8981

VL - 38

JO - IOP Conference Series: Materials Science and Engineering

JF - IOP Conference Series: Materials Science and Engineering

IS - 1

M1 - 012043

T2 - International Conference on Functional Materials and Nanotechnologies, FM and NT 2012

Y2 - 17 April 2012 through 20 April 2012

ER -

Measurements of SiO₂ glass surface parameters by methods of microscopy

Abstract

OECD Field of Science

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