Abstract
Nanostructured carbon black - polyisoprene composite is prepared and investigated. A giant reversible tensoresistive effect - dependence of electrical resistance vs. uniaxial tension deformation - is found. A new application of the conductive atomic force microscope for the carbon black network mapping in a nonconducting matrix is reported.
| Original language | English |
|---|---|
| Pages (from-to) | 113-117 |
| Number of pages | 5 |
| Journal | Proceedings of SPIE - The International Society for Optical Engineering |
| Volume | 4627 |
| Issue number | 1 |
| DOIs | |
| Publication status | Published - 20 Feb 2002 |
Keywords
- Atomic force microscopy
- Electro-conductive polymer nanocomposite
- Reversible tensoresistive effect
- Sensor material
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