Neutron irradiation effects on sol-gel PZT thin films

K. Kundzins; V. Zauls; M. Kundzins; A. Sternberg; L. Čakare; R. Bittner; K. Humer; H. W. Weber

doi:10.1080/00150190108008682

Neutron irradiation effects on sol-gel PZT thin films

K. Kundzins^*
, V. Zauls
, M. Kundzins
, A. Sternberg
, L. Čakare
, R. Bittner
, K. Humer
, H. W. Weber

^*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

7 Citations (Scopus)

Abstract

Preferentially (100) oriented PbZr0.53Ti0.47O3 (PZT) sol-gel films spin cited on Si/TiO2/Pt substrates are studied. Si/TiO2/Pt/PZT/Au heterostructures exposed to high fluence neutron irradiation (2 × 1018 n/cm2, average energy >0.1 MeV; accompanied by gamma rays dose 7.1 × 109 rad, energy ∼ 1 MeV; Tirrad.<60°C) are examined. Recovering of properties is observed at post-irradiation isochronal annealing to elevated temperatures. Dielectric permittivity as well as tg6 decrease after neutron irradiation. The most pronounced radiation-induced polarization change exhibited by the shape of hysteresis loops is caused by an internal bias field.

Original language	English
Pages (from-to)	285-290
Number of pages	6
Journal	Ferroelectrics
Volume	258
Issue number	1
DOIs	https://doi.org/10.1080/00150190108008682
Publication status	Published - 2001

Keywords

dielectric permittivity
internal bias field
neutron irradiation
polarization
PZT sol-gel films

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10.1080/00150190108008682

Cite this

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title = "Neutron irradiation effects on sol-gel PZT thin films",

abstract = "Preferentially (100) oriented PbZr0.53Ti0.47O3 (PZT) sol-gel films spin cited on Si/TiO2/Pt substrates are studied. Si/TiO2/Pt/PZT/Au heterostructures exposed to high fluence neutron irradiation (2 × 1018 n/cm2, average energy >0.1 MeV; accompanied by gamma rays dose 7.1 × 109 rad, energy ∼ 1 MeV; Tirrad.<60°C) are examined. Recovering of properties is observed at post-irradiation isochronal annealing to elevated temperatures. Dielectric permittivity as well as tg6 decrease after neutron irradiation. The most pronounced radiation-induced polarization change exhibited by the shape of hysteresis loops is caused by an internal bias field.",

keywords = "dielectric permittivity, internal bias field, neutron irradiation, polarization, PZT sol-gel films",

author = "K. Kundzins and V. Zauls and M. Kundzins and A. Sternberg and L. {\v C}akare and R. Bittner and K. Humer and Weber, \{H. W.\}",

year = "2001",

doi = "10.1080/00150190108008682",

language = "English",

volume = "258",

pages = "285--290",

journal = "Ferroelectrics",

issn = "0015-0193",

publisher = "Taylor and Francis Ltd.",

number = "1",

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TY - JOUR

T1 - Neutron irradiation effects on sol-gel PZT thin films

AU - Kundzins, K.

AU - Zauls, V.

AU - Kundzins, M.

AU - Sternberg, A.

AU - Čakare, L.

AU - Bittner, R.

AU - Humer, K.

AU - Weber, H. W.

PY - 2001

Y1 - 2001

N2 - Preferentially (100) oriented PbZr0.53Ti0.47O3 (PZT) sol-gel films spin cited on Si/TiO2/Pt substrates are studied. Si/TiO2/Pt/PZT/Au heterostructures exposed to high fluence neutron irradiation (2 × 1018 n/cm2, average energy >0.1 MeV; accompanied by gamma rays dose 7.1 × 109 rad, energy ∼ 1 MeV; Tirrad.<60°C) are examined. Recovering of properties is observed at post-irradiation isochronal annealing to elevated temperatures. Dielectric permittivity as well as tg6 decrease after neutron irradiation. The most pronounced radiation-induced polarization change exhibited by the shape of hysteresis loops is caused by an internal bias field.

AB - Preferentially (100) oriented PbZr0.53Ti0.47O3 (PZT) sol-gel films spin cited on Si/TiO2/Pt substrates are studied. Si/TiO2/Pt/PZT/Au heterostructures exposed to high fluence neutron irradiation (2 × 1018 n/cm2, average energy >0.1 MeV; accompanied by gamma rays dose 7.1 × 109 rad, energy ∼ 1 MeV; Tirrad.<60°C) are examined. Recovering of properties is observed at post-irradiation isochronal annealing to elevated temperatures. Dielectric permittivity as well as tg6 decrease after neutron irradiation. The most pronounced radiation-induced polarization change exhibited by the shape of hysteresis loops is caused by an internal bias field.

KW - dielectric permittivity

KW - internal bias field

KW - neutron irradiation

KW - polarization

KW - PZT sol-gel films

UR - https://www.scopus.com/pages/publications/33746272089

U2 - 10.1080/00150190108008682

DO - 10.1080/00150190108008682

M3 - Article

AN - SCOPUS:33746272089

SN - 0015-0193

VL - 258

SP - 285

EP - 290

JO - Ferroelectrics

JF - Ferroelectrics

IS - 1

ER -

Neutron irradiation effects on sol-gel PZT thin films

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Keywords

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