Optical properties of lead-free NKN films from transmission and spectral ellipsometry

R. Schwarz; L. Santos; R. Ayouchi; S. R. Bhattacharyya; U. Mardolcar; M. Leal; A. Kholkin

doi:10.1080/00150193.2013.821018

Optical properties of lead-free NKN films from transmission and spectral ellipsometry

R. Schwarz^*
, L. Santos
, R. Ayouchi
, S. R. Bhattacharyya
, U. Mardolcar
, M. Leal
, A. Kholkin

^*Corresponding author for this work

University of Lisbon
University of Aveiro

Research output: Contribution to journal › Conference article › peer-review

1 Citation (Scopus)

Abstract

Thin films of lead-free Na_xK_1-xNbO₃ (NKN) were prepared by pulsed laser deposition (PLD) from ceramic targets of stoichiometric NKN or doped with 6% of lithium niobate (LN). At a deposition temperature of 600°C a strong dependence of film morphology on laser fluence is revealed by SEM microscopy. Optical properties like band gap and index of refraction were obtained through transmission measurements and analysis based on the Tauc model. The results were compared to spectral ellipsometry using a fit to the Tauc-Lorentz model, and slightly smaller band gap values were obtained. C-V characteristics of sandwich structures yielded high permittivity of 380 in pure NKN films and tunability at 1 kHz of 3.2% at 1.5 MV/m applied electric field.

Original language	English
Pages (from-to)	118-127
Number of pages	10
Journal	Ferroelectrics
Volume	446
Issue number	1
DOIs	https://doi.org/10.1080/00150193.2013.821018
Publication status	Published - 2013
Externally published	Yes
Event	11th European Conference on Applications of Polar Dielectrics, ECAPD 2012 - Aveiro, Portugal Duration: 9 Jul 2012 → 13 Jul 2012

Keywords

Band gap
NKN
Optical transmission
PLD
Spectral ellipsometry
Thin film

Access to Document

10.1080/00150193.2013.821018

Cite this

@article{ed2bb3a2e3b2470d88cba10982579d8d,

title = "Optical properties of lead-free NKN films from transmission and spectral ellipsometry",

abstract = "Thin films of lead-free NaxK1-xNbO3 (NKN) were prepared by pulsed laser deposition (PLD) from ceramic targets of stoichiometric NKN or doped with 6\% of lithium niobate (LN). At a deposition temperature of 600°C a strong dependence of film morphology on laser fluence is revealed by SEM microscopy. Optical properties like band gap and index of refraction were obtained through transmission measurements and analysis based on the Tauc model. The results were compared to spectral ellipsometry using a fit to the Tauc-Lorentz model, and slightly smaller band gap values were obtained. C-V characteristics of sandwich structures yielded high permittivity of 380 in pure NKN films and tunability at 1 kHz of 3.2\% at 1.5 MV/m applied electric field.",

keywords = "Band gap, NKN, Optical transmission, PLD, Spectral ellipsometry, Thin film",

author = "R. Schwarz and L. Santos and R. Ayouchi and Bhattacharyya, \{S. R.\} and U. Mardolcar and M. Leal and A. Kholkin",

year = "2013",

doi = "10.1080/00150193.2013.821018",

language = "English",

volume = "446",

pages = "118--127",

journal = "Ferroelectrics",

issn = "0015-0193",

publisher = "Taylor and Francis Ltd.",

number = "1",

note = "11th European Conference on Applications of Polar Dielectrics, ECAPD 2012 ; Conference date: 09-07-2012 Through 13-07-2012",

}

TY - JOUR

T1 - Optical properties of lead-free NKN films from transmission and spectral ellipsometry

AU - Schwarz, R.

AU - Santos, L.

AU - Ayouchi, R.

AU - Bhattacharyya, S. R.

AU - Mardolcar, U.

AU - Leal, M.

AU - Kholkin, A.

PY - 2013

Y1 - 2013

N2 - Thin films of lead-free NaxK1-xNbO3 (NKN) were prepared by pulsed laser deposition (PLD) from ceramic targets of stoichiometric NKN or doped with 6% of lithium niobate (LN). At a deposition temperature of 600°C a strong dependence of film morphology on laser fluence is revealed by SEM microscopy. Optical properties like band gap and index of refraction were obtained through transmission measurements and analysis based on the Tauc model. The results were compared to spectral ellipsometry using a fit to the Tauc-Lorentz model, and slightly smaller band gap values were obtained. C-V characteristics of sandwich structures yielded high permittivity of 380 in pure NKN films and tunability at 1 kHz of 3.2% at 1.5 MV/m applied electric field.

AB - Thin films of lead-free NaxK1-xNbO3 (NKN) were prepared by pulsed laser deposition (PLD) from ceramic targets of stoichiometric NKN or doped with 6% of lithium niobate (LN). At a deposition temperature of 600°C a strong dependence of film morphology on laser fluence is revealed by SEM microscopy. Optical properties like band gap and index of refraction were obtained through transmission measurements and analysis based on the Tauc model. The results were compared to spectral ellipsometry using a fit to the Tauc-Lorentz model, and slightly smaller band gap values were obtained. C-V characteristics of sandwich structures yielded high permittivity of 380 in pure NKN films and tunability at 1 kHz of 3.2% at 1.5 MV/m applied electric field.

KW - Band gap

KW - NKN

KW - Optical transmission

KW - PLD

KW - Spectral ellipsometry

KW - Thin film

UR - https://www.scopus.com/pages/publications/84888623419

U2 - 10.1080/00150193.2013.821018

DO - 10.1080/00150193.2013.821018

M3 - Conference article

AN - SCOPUS:84888623419

SN - 0015-0193

VL - 446

SP - 118

EP - 127

JO - Ferroelectrics

JF - Ferroelectrics

IS - 1

T2 - 11th European Conference on Applications of Polar Dielectrics, ECAPD 2012

Y2 - 9 July 2012 through 13 July 2012

ER -

Optical properties of lead-free NKN films from transmission and spectral ellipsometry

Abstract

Keywords

Access to Document

Other files and links

Fingerprint

Cite this