Abstract
An investigation of neutron irradiation effects on highly oriented antiferroelectric PbZrO3 (PZ) thin films were discussed. The films were prepared by a sol-gel technique by pulsed laser deposition (PLD). The dielectric properties were investigated in a frequency range from 1 to 250 kHz and at a room temperature upto 400°C.It was observed that the films were most sensitive to neutron irradiation in the phase transition temperature T c.
| Original language | English |
|---|---|
| Pages (from-to) | 3239-3246 |
| Number of pages | 8 |
| Journal | Journal of Applied Physics |
| Volume | 96 |
| Issue number | 6 |
| DOIs | |
| Publication status | Published - 15 Sept 2004 |
Fingerprint
Dive into the research topics of 'Oxygen vacancy defects in antiferroelectric PbZrO3 thin film heterostructures after neutron irradiation'. Together they form a unique fingerprint.Cite this
- APA
- Author
- BIBTEX
- Harvard
- Standard
- RIS
- Vancouver