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Oxygen vacancy defects in antiferroelectric PbZrO3 thin film heterostructures after neutron irradiation

  • R. Bittner*
  • , K. Humer
  • , H. W. Weber
  • , K. Kundzins
  • , A. Sternberg
  • , D. A. Lesnyh
  • , D. V. Kulikov
  • , Y. V. Trushin
  • *Corresponding author for this work
  • TU Wien
  • University of Latvia
  • Ioffe Physico-Technical Institute

Research output: Contribution to journalArticlepeer-review

25 Citations (Scopus)

Abstract

An investigation of neutron irradiation effects on highly oriented antiferroelectric PbZrO3 (PZ) thin films were discussed. The films were prepared by a sol-gel technique by pulsed laser deposition (PLD). The dielectric properties were investigated in a frequency range from 1 to 250 kHz and at a room temperature upto 400°C.It was observed that the films were most sensitive to neutron irradiation in the phase transition temperature T c.

Original languageEnglish
Pages (from-to)3239-3246
Number of pages8
JournalJournal of Applied Physics
Volume96
Issue number6
DOIs
Publication statusPublished - 15 Sept 2004

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