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Phase-sensitive near-field imaging of metal nanoparticles

  • J. Prikulis*
  • , H. Xu
  • , L. Gunnarsson
  • , M. Käll
  • , H. Olin
  • *Corresponding author for this work
  • Chalmers University of Technology

Research output: Contribution to journalArticlepeer-review

45 Citations (Scopus)

Abstract

We report on the near-field imaging of silver nanoparticles using an aperture-type near-field microscope operated in illumination mode. The nanoparticles are imaged as interference patterns, due to far-field superposition of the optical fields emitted from the tip and elastically scattered from localized surface plasmons (SP). Aperture-type probe can thus be used to obtain information on the phase shift associated with localized SP coupling at the illumination wavelength.

Original languageEnglish
Pages (from-to)6211-6214
Number of pages4
JournalJournal of Applied Physics
Volume92
Issue number10
DOIs
Publication statusPublished - 15 Nov 2002
Externally publishedYes

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