Abstract
We report on the near-field imaging of silver nanoparticles using an aperture-type near-field microscope operated in illumination mode. The nanoparticles are imaged as interference patterns, due to far-field superposition of the optical fields emitted from the tip and elastically scattered from localized surface plasmons (SP). Aperture-type probe can thus be used to obtain information on the phase shift associated with localized SP coupling at the illumination wavelength.
| Original language | English |
|---|---|
| Pages (from-to) | 6211-6214 |
| Number of pages | 4 |
| Journal | Journal of Applied Physics |
| Volume | 92 |
| Issue number | 10 |
| DOIs | |
| Publication status | Published - 15 Nov 2002 |
| Externally published | Yes |
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