Physical properties and reentrant behavior in PLZT thin films

M. Melo; E. B. Araujo; E. A. Neradovskaya; A. P. Turygin; A. A. Esin; V. Ya Shur; A. L. Kholkin

doi:10.1080/00150193.2017.1289792

Physical properties and reentrant behavior in PLZT thin films

M. Melo
, E. B. Araujo^*
, E. A. Neradovskaya
, A. P. Turygin
, A. A. Esin
, V. Ya Shur
, A. L. Kholkin

^*Corresponding author for this work

Universidade Estadual Paulista Júlio de Mesquita Filho
Ural Federal University
University of Aveiro

Research output: Contribution to journal › Article › peer-review

Abstract

La-modified lead zirconate titanate (PLZT) thin films were prepared to study their physical properties at macro- and nanoscale. Piezoresponse force microscopy (PFM) studies suggest a local imprint behavior at room temperature. Confirmed by P-E hysteresis loops recorded at 180-300 K, the imprint effect at room temperature tends to disappear at lower temperatures. In addition, the remanent polarization gradually increases and then decreases after reaching a maximum at around 243 K. This behavior suggests the occurrence of a reentrant dipole glass or an activated electric field effect in the studied PLZT films.

Original language	English
Pages (from-to)	1-9
Number of pages	9
Journal	Ferroelectrics
Volume	509
Issue number	1
DOIs	https://doi.org/10.1080/00150193.2017.1289792
Publication status	Published - 12 Mar 2017
Externally published	Yes

Keywords

dipole glass
PLZT
relaxors
thin films

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10.1080/00150193.2017.1289792

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title = "Physical properties and reentrant behavior in PLZT thin films",

abstract = "La-modified lead zirconate titanate (PLZT) thin films were prepared to study their physical properties at macro- and nanoscale. Piezoresponse force microscopy (PFM) studies suggest a local imprint behavior at room temperature. Confirmed by P-E hysteresis loops recorded at 180-300 K, the imprint effect at room temperature tends to disappear at lower temperatures. In addition, the remanent polarization gradually increases and then decreases after reaching a maximum at around 243 K. This behavior suggests the occurrence of a reentrant dipole glass or an activated electric field effect in the studied PLZT films.",

keywords = "dipole glass, PLZT, relaxors, thin films",

author = "M. Melo and Araujo, \{E. B.\} and Neradovskaya, \{E. A.\} and Turygin, \{A. P.\} and Esin, \{A. A.\} and Shur, \{V. Ya\} and Kholkin, \{A. L.\}",

note = "Publisher Copyright: {\textcopyright} 2017 Taylor \& Francis Group, LLC.",

year = "2017",

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doi = "10.1080/00150193.2017.1289792",

language = "English",

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TY - JOUR

T1 - Physical properties and reentrant behavior in PLZT thin films

AU - Melo, M.

AU - Araujo, E. B.

AU - Neradovskaya, E. A.

AU - Turygin, A. P.

AU - Esin, A. A.

AU - Shur, V. Ya

AU - Kholkin, A. L.

PY - 2017/3/12

Y1 - 2017/3/12

N2 - La-modified lead zirconate titanate (PLZT) thin films were prepared to study their physical properties at macro- and nanoscale. Piezoresponse force microscopy (PFM) studies suggest a local imprint behavior at room temperature. Confirmed by P-E hysteresis loops recorded at 180-300 K, the imprint effect at room temperature tends to disappear at lower temperatures. In addition, the remanent polarization gradually increases and then decreases after reaching a maximum at around 243 K. This behavior suggests the occurrence of a reentrant dipole glass or an activated electric field effect in the studied PLZT films.

AB - La-modified lead zirconate titanate (PLZT) thin films were prepared to study their physical properties at macro- and nanoscale. Piezoresponse force microscopy (PFM) studies suggest a local imprint behavior at room temperature. Confirmed by P-E hysteresis loops recorded at 180-300 K, the imprint effect at room temperature tends to disappear at lower temperatures. In addition, the remanent polarization gradually increases and then decreases after reaching a maximum at around 243 K. This behavior suggests the occurrence of a reentrant dipole glass or an activated electric field effect in the studied PLZT films.

KW - dipole glass

KW - PLZT

KW - relaxors

KW - thin films

UR - https://www.scopus.com/pages/publications/85019122061

U2 - 10.1080/00150193.2017.1289792

DO - 10.1080/00150193.2017.1289792

M3 - Article

AN - SCOPUS:85019122061

SN - 0015-0193

VL - 509

SP - 1

EP - 9

JO - Ferroelectrics

JF - Ferroelectrics

IS - 1

ER -

Physical properties and reentrant behavior in PLZT thin films

Abstract

Keywords

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