Skip to main navigation Skip to search Skip to main content

Piezoelectric response of pulsed laser deposited heterostructures PZT/YBCO, PLZT/YBCO

  • M. Tyunina*
  • , A. Sternberg
  • , V. Zauls
  • , M. Kundzinsh
  • , I. Shorubalko
  • *Corresponding author for this work
  • University of Latvia

Research output: Contribution to journalArticlepeer-review

Abstract

Thin films of lead zirconate titanate (PZT) and La doped lead zirconate titanate (PLZT), coupled to layers of YBa2Cu3O7 (YBCO), were formed by pulsed laser deposition on MgO(100) substrates. Interferometric studies of piezoelectric response of the heterostructures were performed with respect to DC electrical bias and AC measurement frequency. The piezoelectric coefficient demonstrated a hysteresis, consistent with polarization switching and related to residual stress in PZT and PLZT films. A strong increase in the values of piezoelectric coefficient d33 from 15...30 pm/V up to 200...250 pm/V was found in both PZT and PLZT films with decrease in the measurement frequency from 1 kHz to 60 Hz.

Original languageEnglish
Pages (from-to)Pr9-183-Pr9-186
JournalJournal De Physique. IV : JP
Volume8
Issue number9
DOIs
Publication statusPublished - Dec 1998

Fingerprint

Dive into the research topics of 'Piezoelectric response of pulsed laser deposited heterostructures PZT/YBCO, PLZT/YBCO'. Together they form a unique fingerprint.

Cite this