Abstract
Comparative analysis of pyroelectric and piezoelectric hysteresis loops of thin PbZr0.54Ti0.46O3 + 10 mol % PbO films formed under the same conditions on pyroceram and silicon substrates has been performed. The significant differences in the behavior of the parameters under study are attributed to the different character of the biaxial stress acting on a ferroelectric film from pyroceram and silicon substrates.
| Original language | English |
|---|---|
| Pages (from-to) | 1386-1387 |
| Number of pages | 2 |
| Journal | Bulletin of the Russian Academy of Sciences: Physics |
| Volume | 71 |
| Issue number | 10 |
| DOIs | |
| Publication status | Published - Oct 2007 |
| Externally published | Yes |
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