Skip to main navigation Skip to search Skip to main content

Sensitivity of extended X-ray-absorption fine structure to thermal expansion

  • G. Dalba
  • , P. Fornasini
  • , R. Grisenti
  • , J. Purans
  • University of Trento
  • National Research Council of Italy

Research output: Contribution to journalArticlepeer-review

159 Citations (Scopus)

Abstract

The sensitivity of extended x-ray-absorption fine structure (EXAFS) to thermal expansion has been studied by temperature-dependent measurements on germanium. The first cumulant does not reproduce the thermal expansion owing to vibrations normal to the bond. The perpendicular relative displacement ⟨Δu21⟩ has been for the first time experimentally obtained; the ratio ⟨Δu21⟩/⟨Δu2|is in agreement with vibrational model calculations. Low-temperature quantum effects on the 3rd cumulant have been for the first time observed. The possibility of measuring thermal expansion from the 3rd cumulant is demonstrated, provided that quantum effects are taken into account.

Original languageEnglish
Pages (from-to)4240-4243
Number of pages4
JournalPhysical Review Letters
Volume82
Issue number21
DOIs
Publication statusPublished - 1999

Fingerprint

Dive into the research topics of 'Sensitivity of extended X-ray-absorption fine structure to thermal expansion'. Together they form a unique fingerprint.

Cite this