Structural and optical characterization of Ba0.8Sr0.2TiO3 PLD deposited films

I. Aulika; J. Pokorny; V. Zauls; K. Kundzins; M. Rutkis; J. Petzelt

doi:10.1016/j.optmat.2007.05.004

Structural and optical characterization of Ba_0.8Sr_0.2TiO₃ PLD deposited films

I. Aulika^*
, J. Pokorny
, V. Zauls
, K. Kundzins
, M. Rutkis
, J. Petzelt

^*Corresponding author for this work

Czech Academy of Sciences

Research output: Contribution to journal › Article › peer-review

15 Citations (Scopus)

Abstract

Structural and optical properties of Ba_0.8Sr_0.2TiO₃(BST) ferroelectric thin films, deposited by the pulsed laser ablation (PLD) technique on Si/SiO₂/Ti/Pt, Si/SrRuO₃ and Si substrates, were performed by X-ray diffraction, micro Raman, atomic force microscopy (AFM), and optical reflectometry measurements. Temperature dependences of the Raman spectrum, and room temperature refractive and extinction indices, and surface roughness were evaluated.

Original language	English
Pages (from-to)	1017-1022
Number of pages	6
Journal	Optical Materials
Volume	30
Issue number	7
DOIs	https://doi.org/10.1016/j.optmat.2007.05.004
Publication status	Published - Mar 2008

Keywords

Ferroelectric
Internal stress
Optical properties
Raman scattering
Structure
Thin films

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10.1016/j.optmat.2007.05.004

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title = "Structural and optical characterization of Ba0.8Sr0.2TiO3 PLD deposited films",

abstract = "Structural and optical properties of Ba0.8Sr0.2TiO3(BST) ferroelectric thin films, deposited by the pulsed laser ablation (PLD) technique on Si/SiO2/Ti/Pt, Si/SrRuO3 and Si substrates, were performed by X-ray diffraction, micro Raman, atomic force microscopy (AFM), and optical reflectometry measurements. Temperature dependences of the Raman spectrum, and room temperature refractive and extinction indices, and surface roughness were evaluated.",

keywords = "Ferroelectric, Internal stress, Optical properties, Raman scattering, Structure, Thin films",

author = "I. Aulika and J. Pokorny and V. Zauls and K. Kundzins and M. Rutkis and J. Petzelt",

year = "2008",

month = mar,

doi = "10.1016/j.optmat.2007.05.004",

language = "English",

volume = "30",

pages = "1017--1022",

journal = "Optical Materials",

issn = "0925-3467",

publisher = "Elsevier B.V.",

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TY - JOUR

T1 - Structural and optical characterization of Ba0.8Sr0.2TiO3 PLD deposited films

AU - Aulika, I.

AU - Pokorny, J.

AU - Zauls, V.

AU - Kundzins, K.

AU - Rutkis, M.

AU - Petzelt, J.

PY - 2008/3

Y1 - 2008/3

N2 - Structural and optical properties of Ba0.8Sr0.2TiO3(BST) ferroelectric thin films, deposited by the pulsed laser ablation (PLD) technique on Si/SiO2/Ti/Pt, Si/SrRuO3 and Si substrates, were performed by X-ray diffraction, micro Raman, atomic force microscopy (AFM), and optical reflectometry measurements. Temperature dependences of the Raman spectrum, and room temperature refractive and extinction indices, and surface roughness were evaluated.

AB - Structural and optical properties of Ba0.8Sr0.2TiO3(BST) ferroelectric thin films, deposited by the pulsed laser ablation (PLD) technique on Si/SiO2/Ti/Pt, Si/SrRuO3 and Si substrates, were performed by X-ray diffraction, micro Raman, atomic force microscopy (AFM), and optical reflectometry measurements. Temperature dependences of the Raman spectrum, and room temperature refractive and extinction indices, and surface roughness were evaluated.

KW - Ferroelectric

KW - Internal stress

KW - Optical properties

KW - Raman scattering

KW - Structure

KW - Thin films

UR - https://www.scopus.com/pages/publications/39449106744

U2 - 10.1016/j.optmat.2007.05.004

DO - 10.1016/j.optmat.2007.05.004

M3 - Article

AN - SCOPUS:39449106744

SN - 0925-3467

VL - 30

SP - 1017

EP - 1022

JO - Optical Materials

JF - Optical Materials

IS - 7

ER -

Structural and optical characterization of Ba_0.8Sr_0.2TiO₃ PLD deposited films

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Keywords

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