Structural studies of titanium oxide multilayers

G. P. Karwasz; A. Miotello; E. Zomer; R. S. Brusa; B. Kościelska; C. Armellini; A. Kuzmin

doi:10.12693/APhysPolA.107.977

Structural studies of titanium oxide multilayers

G. P. Karwasz^*
, A. Miotello
, E. Zomer
, R. S. Brusa
, B. Kościelska
, C. Armellini
, A. Kuzmin

^*Corresponding author for this work

EXAFS Spectroscopy Laboratory, Institute of Solid State Physics

University of Trento
Gdańsk University of Technology
National Research Council of Italy

Research output: Contribution to journal › Article › peer-review

4 Citations (Scopus)

Abstract

Multilayers of titanium oxide on conductive glasses (silica, covered with indium/tin and tin oxides) were obtained by different methods (from suspension, by sol-gel, by vacuum sputtering). X-ray diffraction and positron annihilation depth-resolved characterization of these samples are presented. The data allow us to determine optimal deposition parameters, in order to obtain the anatase phase, important in practical applications in photoelectrochemical cells.

Original language	English
Pages (from-to)	977-982
Number of pages	6
Journal	Acta Physica Polonica A
Volume	107
Issue number	6
DOIs	https://doi.org/10.12693/APhysPolA.107.977
Publication status	Published - Jun 2005

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10.12693/APhysPolA.107.977

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abstract = "Multilayers of titanium oxide on conductive glasses (silica, covered with indium/tin and tin oxides) were obtained by different methods (from suspension, by sol-gel, by vacuum sputtering). X-ray diffraction and positron annihilation depth-resolved characterization of these samples are presented. The data allow us to determine optimal deposition parameters, in order to obtain the anatase phase, important in practical applications in photoelectrochemical cells.",

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AU - Karwasz, G. P.

AU - Miotello, A.

AU - Zomer, E.

AU - Brusa, R. S.

AU - Kościelska, B.

AU - Armellini, C.

AU - Kuzmin, A.

PY - 2005/6

Y1 - 2005/6

N2 - Multilayers of titanium oxide on conductive glasses (silica, covered with indium/tin and tin oxides) were obtained by different methods (from suspension, by sol-gel, by vacuum sputtering). X-ray diffraction and positron annihilation depth-resolved characterization of these samples are presented. The data allow us to determine optimal deposition parameters, in order to obtain the anatase phase, important in practical applications in photoelectrochemical cells.

AB - Multilayers of titanium oxide on conductive glasses (silica, covered with indium/tin and tin oxides) were obtained by different methods (from suspension, by sol-gel, by vacuum sputtering). X-ray diffraction and positron annihilation depth-resolved characterization of these samples are presented. The data allow us to determine optimal deposition parameters, in order to obtain the anatase phase, important in practical applications in photoelectrochemical cells.

UR - https://www.scopus.com/pages/publications/20744455340

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M3 - Article

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JO - Acta Physica Polonica A

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IS - 6

ER -

Structural studies of titanium oxide multilayers

Abstract

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