Studies of local induced polarization in modified ferroelectric thin films

K. Kundzins; V. Zauls; L. Cakare-Samardzija; A. Sternberg

doi:10.1080/00150190600889148

Studies of local induced polarization in modified ferroelectric thin films

K. Kundzins
, V. Zauls
, L. Cakare-Samardzija
, A. Sternberg^*

^*Corresponding author for this work

J. Stefan Institute
University of Latvia

Research output: Contribution to journal › Conference article › peer-review

Abstract

Composition-structure-properties relationships were studied in iron doped compositions of lead zirconate-titanate thin films using dielectric spectroscopy and atomic force microscopy. Samples under investigation were sol-gel deposited lead zirconate titanate PbZr_0,50Ti_0,50O₃ (PZT) family thin films on Pt/TiO₂/SiO₂/Si substrates. Spatially resolved piezoresponse imaging of poled regions and polarization switching response in various granular regions polar ferroelectric thin films was studied using scanning probe microscope operating in modified multi-pass regimes combining voltage lithography mode with immediate testing of local surface piezoresponse.

Original language	English
Pages (from-to)	115-120
Number of pages	6
Journal	Ferroelectrics
Volume	340
Issue number	1 PART 1
DOIs	https://doi.org/10.1080/00150190600889148
Publication status	Published - 2006
Event	International Symposium on Micro- and Nano-Scale Domain Structuring in Ferroelectrics, ISDS'05 - Ekaterinburg, Russian Federation Duration: 15 Nov 2005 → 19 Nov 2005

Keywords

Atomic force microscopy
Dielectric spectroscopy
Lead zirconate-titanate films

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10.1080/00150190600889148

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title = "Studies of local induced polarization in modified ferroelectric thin films",

abstract = "Composition-structure-properties relationships were studied in iron doped compositions of lead zirconate-titanate thin films using dielectric spectroscopy and atomic force microscopy. Samples under investigation were sol-gel deposited lead zirconate titanate PbZr0,50Ti0,50O3 (PZT) family thin films on Pt/TiO2/SiO2/Si substrates. Spatially resolved piezoresponse imaging of poled regions and polarization switching response in various granular regions polar ferroelectric thin films was studied using scanning probe microscope operating in modified multi-pass regimes combining voltage lithography mode with immediate testing of local surface piezoresponse.",

keywords = "Atomic force microscopy, Dielectric spectroscopy, Lead zirconate-titanate films",

author = "K. Kundzins and V. Zauls and L. Cakare-Samardzija and A. Sternberg",

year = "2006",

doi = "10.1080/00150190600889148",

language = "English",

volume = "340",

pages = "115--120",

journal = "Ferroelectrics",

issn = "0015-0193",

publisher = "Taylor and Francis Ltd.",

number = "1 PART 1",

note = "International Symposium on Micro- and Nano-Scale Domain Structuring in Ferroelectrics, ISDS'05 ; Conference date: 15-11-2005 Through 19-11-2005",

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TY - JOUR

T1 - Studies of local induced polarization in modified ferroelectric thin films

AU - Kundzins, K.

AU - Zauls, V.

AU - Cakare-Samardzija, L.

AU - Sternberg, A.

PY - 2006

Y1 - 2006

N2 - Composition-structure-properties relationships were studied in iron doped compositions of lead zirconate-titanate thin films using dielectric spectroscopy and atomic force microscopy. Samples under investigation were sol-gel deposited lead zirconate titanate PbZr0,50Ti0,50O3 (PZT) family thin films on Pt/TiO2/SiO2/Si substrates. Spatially resolved piezoresponse imaging of poled regions and polarization switching response in various granular regions polar ferroelectric thin films was studied using scanning probe microscope operating in modified multi-pass regimes combining voltage lithography mode with immediate testing of local surface piezoresponse.

AB - Composition-structure-properties relationships were studied in iron doped compositions of lead zirconate-titanate thin films using dielectric spectroscopy and atomic force microscopy. Samples under investigation were sol-gel deposited lead zirconate titanate PbZr0,50Ti0,50O3 (PZT) family thin films on Pt/TiO2/SiO2/Si substrates. Spatially resolved piezoresponse imaging of poled regions and polarization switching response in various granular regions polar ferroelectric thin films was studied using scanning probe microscope operating in modified multi-pass regimes combining voltage lithography mode with immediate testing of local surface piezoresponse.

KW - Atomic force microscopy

KW - Dielectric spectroscopy

KW - Lead zirconate-titanate films

UR - https://www.scopus.com/pages/publications/75949119676

U2 - 10.1080/00150190600889148

DO - 10.1080/00150190600889148

M3 - Conference article

AN - SCOPUS:75949119676

SN - 0015-0193

VL - 340

SP - 115

EP - 120

JO - Ferroelectrics

JF - Ferroelectrics

IS - 1 PART 1

T2 - International Symposium on Micro- and Nano-Scale Domain Structuring in Ferroelectrics, ISDS'05

Y2 - 15 November 2005 through 19 November 2005

ER -

Studies of local induced polarization in modified ferroelectric thin films

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Keywords

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