Abstract
Composition-structure-properties relationships were studied in iron doped compositions of lead zirconate titanate using dielectric spectroscopy and atomic force microscopy. Samples under investigation were sol-gel deposited lead zirconate titanate PbZr 0,50 Ti 0,50 O 3 (PZT) family thin films and heterostructures on Si/SiO 2 /Ti/Pt substrates. Spatially resolved piezoresponse imaging of poled regions and polarization switching response in various granular regions polar ferroelectric thin films was studied using atomic force microscope operating in modified multi-pass regimes combining voltage lithography mode with immediate testing of local surface piezoresponse profiles.
| Original language | English |
|---|---|
| Pages (from-to) | 269-274 |
| Number of pages | 6 |
| Journal | Ferroelectrics |
| Volume | 335 |
| DOIs | |
| Publication status | Published - 1 Jul 2006 |
Keywords
- Piezoresponse
- PZT
- Thin films
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