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Studies of local induced polarization in modified ferroelectric thin films

  • L. Cakare-Samardzija
  • , K. Kundzins
  • , V. Zauls*
  • , A. Sternberg
  • *Corresponding author for this work
  • Jožef Stefan Institute
  • University of Latvia

Research output: Contribution to journal › Article › peer-review

Abstract

Composition-structure-properties relationships were studied in iron doped compositions of lead zirconate titanate using dielectric spectroscopy and atomic force microscopy. Samples under investigation were sol-gel deposited lead zirconate titanate PbZr 0,50 Ti 0,50 O 3 (PZT) family thin films and heterostructures on Si/SiO 2 /Ti/Pt substrates. Spatially resolved piezoresponse imaging of poled regions and polarization switching response in various granular regions polar ferroelectric thin films was studied using atomic force microscope operating in modified multi-pass regimes combining voltage lithography mode with immediate testing of local surface piezoresponse profiles.

Original languageEnglish
Pages (from-to)269-274
Number of pages6
JournalFerroelectrics
Volume335
DOIs
Publication statusPublished - 1 Jul 2006

Keywords

  • Piezoresponse
  • PZT
  • Thin films

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