X-ray characterization and domain structure of high-quality SrBi 2Ta2O9 single-crystals grown by self-flux solution method

Harvey Amorín; Igor K. Bdikin; Vladimir V. Shvartsman; M. Elisabeth V. Costa; Andrei L. Kholkin

doi:10.1080/10584580490896616

X-ray characterization and domain structure of high-quality SrBi ₂Ta₂O₉ single-crystals grown by self-flux solution method

Harvey Amorín^*
, Igor K. Bdikin
, Vladimir V. Shvartsman
, M. Elisabeth V. Costa
, Andrei L. Kholkin

^*Corresponding author for this work

University of Aveiro
Institute of Solid State Physics

Research output: Contribution to journal › Article › peer-review

3 Citations (Scopus)

Abstract

High-quality SrBi₂Ta₂O₉ single crystals were grown by self-flux solution method. According to x-ray topography the crystals with layered habitus and typical dimensions up to ∼7 × 5 × 0.05 mm³ show perfect (001)-orientation with the edges directed along [110] axes. The quality of the crystals was also confirmed by high-field measurements, which did not detect any ferroelectric hysteresis along the c-axis crystallographic direction thus confirming that the polarization vector lies entirely in the a-b plane. Sharp phase transition (T_c = 350°C) with well-defined Curie-Weiss behavior above the transition was found. Examination of the domain structure revealed well-faceted 90° domains forming due to mechanical twinning above the transition to ferroelectric phase.

Original language	English
Pages (from-to)	259-268
Number of pages	10
Journal	Integrated Ferroelectrics
Volume	68
DOIs	https://doi.org/10.1080/10584580490896616
Publication status	Published - 2004
Externally published	Yes

Keywords

Domain structure
High temperature self-flux method
Piezoelectric force microscopy
SrBiTaO single-crystals
X-ray topography analysis

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10.1080/10584580490896616

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@article{8bbab26ae70c4e328f08fabf71107ef4,

title = "X-ray characterization and domain structure of high-quality SrBi 2Ta2O9 single-crystals grown by self-flux solution method",

abstract = "High-quality SrBi2Ta2O9 single crystals were grown by self-flux solution method. According to x-ray topography the crystals with layered habitus and typical dimensions up to ∼7 {\texttimes} 5 {\texttimes} 0.05 mm3 show perfect (001)-orientation with the edges directed along [110] axes. The quality of the crystals was also confirmed by high-field measurements, which did not detect any ferroelectric hysteresis along the c-axis crystallographic direction thus confirming that the polarization vector lies entirely in the a-b plane. Sharp phase transition (Tc = 350°C) with well-defined Curie-Weiss behavior above the transition was found. Examination of the domain structure revealed well-faceted 90° domains forming due to mechanical twinning above the transition to ferroelectric phase.",

keywords = "Domain structure, High temperature self-flux method, Piezoelectric force microscopy, SrBiTaO single-crystals, X-ray topography analysis",

author = "Harvey Amor{\'i}n and Bdikin, \{Igor K.\} and Shvartsman, \{Vladimir V.\} and Costa, \{M. Elisabeth V.\} and Kholkin, \{Andrei L.\}",

year = "2004",

doi = "10.1080/10584580490896616",

language = "English",

volume = "68",

pages = "259--268",

journal = "Integrated Ferroelectrics",

issn = "1058-4587",

publisher = "Taylor and Francis Ltd.",

}

TY - JOUR

T1 - X-ray characterization and domain structure of high-quality SrBi 2Ta2O9 single-crystals grown by self-flux solution method

AU - Amorín, Harvey

AU - Bdikin, Igor K.

AU - Shvartsman, Vladimir V.

AU - Costa, M. Elisabeth V.

AU - Kholkin, Andrei L.

PY - 2004

Y1 - 2004

N2 - High-quality SrBi2Ta2O9 single crystals were grown by self-flux solution method. According to x-ray topography the crystals with layered habitus and typical dimensions up to ∼7 × 5 × 0.05 mm3 show perfect (001)-orientation with the edges directed along [110] axes. The quality of the crystals was also confirmed by high-field measurements, which did not detect any ferroelectric hysteresis along the c-axis crystallographic direction thus confirming that the polarization vector lies entirely in the a-b plane. Sharp phase transition (Tc = 350°C) with well-defined Curie-Weiss behavior above the transition was found. Examination of the domain structure revealed well-faceted 90° domains forming due to mechanical twinning above the transition to ferroelectric phase.

AB - High-quality SrBi2Ta2O9 single crystals were grown by self-flux solution method. According to x-ray topography the crystals with layered habitus and typical dimensions up to ∼7 × 5 × 0.05 mm3 show perfect (001)-orientation with the edges directed along [110] axes. The quality of the crystals was also confirmed by high-field measurements, which did not detect any ferroelectric hysteresis along the c-axis crystallographic direction thus confirming that the polarization vector lies entirely in the a-b plane. Sharp phase transition (Tc = 350°C) with well-defined Curie-Weiss behavior above the transition was found. Examination of the domain structure revealed well-faceted 90° domains forming due to mechanical twinning above the transition to ferroelectric phase.

KW - Domain structure

KW - High temperature self-flux method

KW - Piezoelectric force microscopy

KW - SrBiTaO single-crystals

KW - X-ray topography analysis

UR - https://www.scopus.com/pages/publications/33751172350

U2 - 10.1080/10584580490896616

DO - 10.1080/10584580490896616

M3 - Article

AN - SCOPUS:33751172350

SN - 1058-4587

VL - 68

SP - 259

EP - 268

JO - Integrated Ferroelectrics

JF - Integrated Ferroelectrics

ER -

X-ray characterization and domain structure of high-quality SrBi ₂Ta₂O₉ single-crystals grown by self-flux solution method

Abstract

Keywords

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