X-ray studies on optical and structural properties of ZnO nanostructured thin films

S. Larcheri; C. Armellini; F. Rocca; A. Kuzmin; R. Kalendarev; G. Dalba; R. Graziola; J. Purans; D. Pailharey; F. Jandard

doi:10.1016/j.spmi.2005.08.048

X-ray studies on optical and structural properties of ZnO nanostructured thin films

S. Larcheri
, C. Armellini
, F. Rocca^*
, A. Kuzmin
, R. Kalendarev
, G. Dalba
, R. Graziola
, J. Purans
, D. Pailharey
, F. Jandard

^*Corresponding author for this work

EXAFS Spectroscopy Laboratory, Institute of Solid State Physics

National Research Council of Italy
University of Latvia
CINaM

Research output: Contribution to journal › Conference article › peer-review

43 Citations (Scopus)

Abstract

X-ray absorption near-edge fine structure (XANES) studies have been carried out on nanostructured ZnO thin films prepared by atmospheric pressure chemical vapour deposition (APCVD). Films have been characterized by X-ray diffraction (XRD) and optical luminescence spectroscopy exciting with laser light (PL) or X-ray (XEOL). According to XRD measurements, all the APCVD samples reveal a highly (002) oriented crystalline structure. The samples have different thickness (less than 1 μm) and show significant shifts of the PL and XEOL bands in the visible region. Zn K-edge XANES spectra were recorded using synchrotron radiation at BM08 of ESRF (France), by detecting photoluminescence yield (PLY) and X-ray fluorescence yield (FLY). The differences between the PLY- and FLY-XANES confirm the possibility of studying the local environment in the luminescence centres and to correlate the structural and optical properties of ZnO nanostructured samples.

Original language	English
Pages (from-to)	267-274
Number of pages	8
Journal	Superlattices and Microstructures
Volume	39
Issue number	1-4
DOIs	https://doi.org/10.1016/j.spmi.2005.08.048
Publication status	Published - Jan 2006
Event	E-MRS 2005 Symposium G: ZnO and Related Materials Part 2 - Duration: 31 May 2005 → 3 Jun 2005

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title = "X-ray studies on optical and structural properties of ZnO nanostructured thin films",

abstract = "X-ray absorption near-edge fine structure (XANES) studies have been carried out on nanostructured ZnO thin films prepared by atmospheric pressure chemical vapour deposition (APCVD). Films have been characterized by X-ray diffraction (XRD) and optical luminescence spectroscopy exciting with laser light (PL) or X-ray (XEOL). According to XRD measurements, all the APCVD samples reveal a highly (002) oriented crystalline structure. The samples have different thickness (less than 1 μm) and show significant shifts of the PL and XEOL bands in the visible region. Zn K-edge XANES spectra were recorded using synchrotron radiation at BM08 of ESRF (France), by detecting photoluminescence yield (PLY) and X-ray fluorescence yield (FLY). The differences between the PLY- and FLY-XANES confirm the possibility of studying the local environment in the luminescence centres and to correlate the structural and optical properties of ZnO nanostructured samples.",

author = "S. Larcheri and C. Armellini and F. Rocca and A. Kuzmin and R. Kalendarev and G. Dalba and R. Graziola and J. Purans and D. Pailharey and F. Jandard",

year = "2006",

month = jan,

doi = "10.1016/j.spmi.2005.08.048",

language = "English",

volume = "39",

pages = "267--274",

journal = "Superlattices and Microstructures",

issn = "0749-6036",

publisher = "Elsevier Ltd",

number = "1-4",

note = "E-MRS 2005 Symposium G: ZnO and Related Materials Part 2 ; Conference date: 31-05-2005 Through 03-06-2005",

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T1 - X-ray studies on optical and structural properties of ZnO nanostructured thin films

AU - Larcheri, S.

AU - Armellini, C.

AU - Rocca, F.

AU - Kuzmin, A.

AU - Kalendarev, R.

AU - Dalba, G.

AU - Graziola, R.

AU - Purans, J.

AU - Pailharey, D.

AU - Jandard, F.

PY - 2006/1

Y1 - 2006/1

N2 - X-ray absorption near-edge fine structure (XANES) studies have been carried out on nanostructured ZnO thin films prepared by atmospheric pressure chemical vapour deposition (APCVD). Films have been characterized by X-ray diffraction (XRD) and optical luminescence spectroscopy exciting with laser light (PL) or X-ray (XEOL). According to XRD measurements, all the APCVD samples reveal a highly (002) oriented crystalline structure. The samples have different thickness (less than 1 μm) and show significant shifts of the PL and XEOL bands in the visible region. Zn K-edge XANES spectra were recorded using synchrotron radiation at BM08 of ESRF (France), by detecting photoluminescence yield (PLY) and X-ray fluorescence yield (FLY). The differences between the PLY- and FLY-XANES confirm the possibility of studying the local environment in the luminescence centres and to correlate the structural and optical properties of ZnO nanostructured samples.

AB - X-ray absorption near-edge fine structure (XANES) studies have been carried out on nanostructured ZnO thin films prepared by atmospheric pressure chemical vapour deposition (APCVD). Films have been characterized by X-ray diffraction (XRD) and optical luminescence spectroscopy exciting with laser light (PL) or X-ray (XEOL). According to XRD measurements, all the APCVD samples reveal a highly (002) oriented crystalline structure. The samples have different thickness (less than 1 μm) and show significant shifts of the PL and XEOL bands in the visible region. Zn K-edge XANES spectra were recorded using synchrotron radiation at BM08 of ESRF (France), by detecting photoluminescence yield (PLY) and X-ray fluorescence yield (FLY). The differences between the PLY- and FLY-XANES confirm the possibility of studying the local environment in the luminescence centres and to correlate the structural and optical properties of ZnO nanostructured samples.

UR - https://www.scopus.com/pages/publications/29344455958

U2 - 10.1016/j.spmi.2005.08.048

DO - 10.1016/j.spmi.2005.08.048

M3 - Conference article

AN - SCOPUS:29344455958

SN - 0749-6036

VL - 39

SP - 267

EP - 274

JO - Superlattices and Microstructures

JF - Superlattices and Microstructures

IS - 1-4

T2 - E-MRS 2005 Symposium G: ZnO and Related Materials Part 2

Y2 - 31 May 2005 through 3 June 2005

ER -

X-ray studies on optical and structural properties of ZnO nanostructured thin films

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