Kopsavilkums
Three-dimensional numerical simulations of the inert gas flow, melt flow and dopant transport in both phases are carried out for silicon single crystal growth using the floating zone method. The mathematical model allows to predict the cooling heat flux density at silicon surfaces and realistically describes the dopant transport in case of doping from the atmosphere. A very good agreement with experiment is obtained for the radial resistivity variation profiles by taking into account the temperature dependence of chemical reaction processes at the free surface.
| Oriģinālvaloda | Angļu |
|---|---|
| Lapas (no-līdz) | 65-71 |
| Lapu skaits | 7 |
| Žurnāls | Journal of Crystal Growth |
| Sējums | 457 |
| DOIs | |
| Publikācijas statuss | Publicēts - 1 janv. 2017 |
OECD Zinātnes nozare
- 1.3 Fizika un astronomija
Nospiedums
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