Pāriet uz galveno navigāciju Pāriet uz meklēšanu Pāriet uz galveno saturu

Adhesion trends and growth mode of ultra-thin copper films on MgO

  • Yuri F. Zhukovskii
  • , Eugene A. Kotomin*
  • , David Fuks
  • , Simon Dorfman
  • , A. Marshall Stoneham
  • , Gunnar Borstel
  • *Šī darba korespondējošais autors
  • University of Latvia
  • Osnabrück University
  • Max Planck Institute for Solid State Research
  • Ben-Gurion University of the Negev
  • Technion-Israel Institute of Technology
  • University College London

Zinātniskās darbības rezultāts: Devums žurnālamZinātniskais raksts (žurnālā)koleģiāli recenzēts

19 Atsauces (Scopus)

Kopsavilkums

Ab initio simulations are performed for Cu atoms adsorbed on the perfect MgO(001) substrate, with an ordered metal coverage varied from 1/4 monolayer (ML), i.e. almost single atoms, up to 1 ML. A strong dependence of the adhesion energy and the sub-monolayer film distance from the substrate on the surface coverage and adsorbate positions (Mg2+ or 02-) is discussed. The nature of interfacial bonding at all coverages is physisorption. When increasing Cu atomic fraction, a decrease of the substrate-induced polarization of adatoms accompanied by an increase of both in-plane metallic bonding and the interfacial distance has been found. Combining results of ab initio calculations with thermodynamic theory (taking into account the lattice mismatch), we show that the metal cluster formation becomes the predominant growth mode even at low Cu coverages, in agreement with experiment.

OriģinālvalodaAngļu
Lapas (no-līdz)4881-4896
Lapu skaits16
ŽurnālsJournal of Physics Condensed Matter
Sējums16
Izdevuma numurs28
DOIs
Publikācijas statussPublicēts - 21 jūl. 2004

Nospiedums

Uzziniet vairāk par pētniecības tēmām “Adhesion trends and growth mode of ultra-thin copper films on MgO”. Kopā tie veido unikālu nospiedumu.

Citēt šo