Antiferroelectric PbZrO3 thin films: Structure, properties and irradiation effects

A. Sternberg; K. Kundzins; V. Zauls; I. Aulika; L. Čakare; R. Bittner; H. Weber; K. Humer; D. Lesnyh; D. Kulikov; Y. Trushin

doi:10.1016/S0955-2219(03)00450-3

Antiferroelectric PbZrO₃ thin films: Structure, properties and irradiation effects

A. Sternberg^*
, K. Kundzins
, V. Zauls
, I. Aulika
, L. Čakare
, R. Bittner
, H. Weber
, K. Humer
, D. Lesnyh
, D. Kulikov
, Y. Trushin

^*Šī darba korespondējošais autors

University of Latvia
J. Stefan Institute
TU Wien
Peter the Great St. Petersburg Polytechnic University

Zinātniskās darbības rezultāts: Devums žurnālam › Zinātniskais raksts (žurnālā) › koleģiāli recenzēts

15 Atsauces (Scopus)

Kopsavilkums

Irradiation effects on highly oriented antiferroelectric PbZrO₃ and ferroelectric Pb_0.92La_0.08(Zr_0.65Ti_0.35) O₃ thin films are investigated being exposed to neutron irradiation up to fluence 2^*10²² m^-2. The higher resistance of antiferroelectric PbZrO₃ thin films as compared to ferroelectric heterostructures to large fluences of neutron irradiation is recognized and discussed. Influence of two factors (structural and charge) was taken into account analysing irradiation effects on materials of different polarization states: ferroelectric PLZT (ceramics and thin films) and antiferroelectric PbZrO₃ films.

Oriģinālvaloda	Angļu
Lapas (no-līdz)	1653-1657
Lapu skaits	5
Žurnāls	Journal of the European Ceramic Society
Sējums	24
Izdevuma numurs	6
DOIs	https://doi.org/10.1016/S0955-2219(03)00450-3
Publikācijas statuss	Publicēts - jūn. 2004

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title = "Antiferroelectric PbZrO3 thin films: Structure, properties and irradiation effects",

abstract = "Irradiation effects on highly oriented antiferroelectric PbZrO3 and ferroelectric Pb0.92La0.08(Zr0.65Ti0.35) O3 thin films are investigated being exposed to neutron irradiation up to fluence 2*1022 m-2. The higher resistance of antiferroelectric PbZrO3 thin films as compared to ferroelectric heterostructures to large fluences of neutron irradiation is recognized and discussed. Influence of two factors (structural and charge) was taken into account analysing irradiation effects on materials of different polarization states: ferroelectric PLZT (ceramics and thin films) and antiferroelectric PbZrO3 films.",

keywords = "Antiferroelectric and ferroelectric thin films, Dielectric properties, Neutron irradiation, Oxygen vacancies, Radiation-induced charges",

author = "A. Sternberg and K. Kundzins and V. Zauls and I. Aulika and L. {\v C}akare and R. Bittner and H. Weber and K. Humer and D. Lesnyh and D. Kulikov and Y. Trushin",

year = "2004",

month = jun,

doi = "10.1016/S0955-2219(03)00450-3",

language = "English",

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journal = "Journal of the European Ceramic Society",

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TY - JOUR

T1 - Antiferroelectric PbZrO3 thin films

T2 - Structure, properties and irradiation effects

AU - Sternberg, A.

AU - Kundzins, K.

AU - Zauls, V.

AU - Aulika, I.

AU - Čakare, L.

AU - Bittner, R.

AU - Weber, H.

AU - Humer, K.

AU - Lesnyh, D.

AU - Kulikov, D.

AU - Trushin, Y.

PY - 2004/6

Y1 - 2004/6

N2 - Irradiation effects on highly oriented antiferroelectric PbZrO3 and ferroelectric Pb0.92La0.08(Zr0.65Ti0.35) O3 thin films are investigated being exposed to neutron irradiation up to fluence 2*1022 m-2. The higher resistance of antiferroelectric PbZrO3 thin films as compared to ferroelectric heterostructures to large fluences of neutron irradiation is recognized and discussed. Influence of two factors (structural and charge) was taken into account analysing irradiation effects on materials of different polarization states: ferroelectric PLZT (ceramics and thin films) and antiferroelectric PbZrO3 films.

AB - Irradiation effects on highly oriented antiferroelectric PbZrO3 and ferroelectric Pb0.92La0.08(Zr0.65Ti0.35) O3 thin films are investigated being exposed to neutron irradiation up to fluence 2*1022 m-2. The higher resistance of antiferroelectric PbZrO3 thin films as compared to ferroelectric heterostructures to large fluences of neutron irradiation is recognized and discussed. Influence of two factors (structural and charge) was taken into account analysing irradiation effects on materials of different polarization states: ferroelectric PLZT (ceramics and thin films) and antiferroelectric PbZrO3 films.

KW - Antiferroelectric and ferroelectric thin films

KW - Dielectric properties

KW - Neutron irradiation

KW - Oxygen vacancies

KW - Radiation-induced charges

UR - https://www.scopus.com/pages/publications/0942278165

U2 - 10.1016/S0955-2219(03)00450-3

DO - 10.1016/S0955-2219(03)00450-3

M3 - Article

AN - SCOPUS:0942278165

SN - 0955-2219

VL - 24

SP - 1653

EP - 1657

JO - Journal of the European Ceramic Society

JF - Journal of the European Ceramic Society

IS - 6

ER -