Combining scanning probe microscopy and x-ray spectroscopy

Carole Fauquet; Maël Dehlinger; Franck Jandard; Sylvain Ferrero; Daniel Pailharey; Sylvia Larcheri; Roberto Graziola; Juris Purans; Aniouar Bjeoumikhov; Alexei Erko; Ivo Zizak; Brahim Dahmani; Didier Tonneau

doi:10.1186/1556-276X-6-308

Combining scanning probe microscopy and x-ray spectroscopy

Carole Fauquet^*
, Maël Dehlinger
, Franck Jandard
, Sylvain Ferrero
, Daniel Pailharey
, Sylvia Larcheri
, Roberto Graziola
, Juris Purans
, Aniouar Bjeoumikhov
, Alexei Erko
, Ivo Zizak
, Brahim Dahmani
, Didier Tonneau

^*Šī darba korespondējošais autors

Plāno kārtiņu laboratorija, Cietvielu fizikas institūts

Aix-Marseille Université
AXESS TECH
University of Trento
IFG GmbH
Helmholtz Centre Berlin for Materials and Energy
LovaLite

Zinātniskās darbības rezultāts: Devums žurnālam › Zinātniskais raksts (žurnālā) › koleģiāli recenzēts

16 Atsauces (Scopus)

Kopsavilkums

A new versatile tool, combining Shear Force Microscopy and X-Ray Spectroscopy was designed and constructed to obtain simultaneously surface topography and chemical mapping. Using a sharp optical fiber as microscope probe, it is possible to collect locally the visible luminescence of the sample. Results of tests on ZnO and on ZnWO₄ thin layers are in perfect agreement with that obtained with other conventional techniques. Twin images obtained by simultaneous acquisition in near field of surface topography and of local visible light emitted by the sample under X-Ray irradiation in synchrotron environment are shown. Replacing the optical fibre by an X-ray capillary, it is possible to collect local X-ray fluorescence of the sample. Preliminary results on Co-Ti sample analysis are presented.

Oriģinālvaloda	Angļu
Raksta numurs	308
Lapas (no-līdz)	X1-6
Žurnāls	Nanoscale Research Letters
Sējums	6
Izdevuma numurs	1
DOIs	https://doi.org/10.1186/1556-276X-6-308
Publikācijas statuss	Publicēts - janv. 2011

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AU - Fauquet, Carole

AU - Dehlinger, Maël

AU - Jandard, Franck

AU - Ferrero, Sylvain

AU - Pailharey, Daniel

AU - Larcheri, Sylvia

AU - Graziola, Roberto

AU - Purans, Juris

AU - Bjeoumikhov, Aniouar

AU - Erko, Alexei

AU - Zizak, Ivo

AU - Dahmani, Brahim

AU - Tonneau, Didier

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AB - A new versatile tool, combining Shear Force Microscopy and X-Ray Spectroscopy was designed and constructed to obtain simultaneously surface topography and chemical mapping. Using a sharp optical fiber as microscope probe, it is possible to collect locally the visible luminescence of the sample. Results of tests on ZnO and on ZnWO4 thin layers are in perfect agreement with that obtained with other conventional techniques. Twin images obtained by simultaneous acquisition in near field of surface topography and of local visible light emitted by the sample under X-Ray irradiation in synchrotron environment are shown. Replacing the optical fibre by an X-ray capillary, it is possible to collect local X-ray fluorescence of the sample. Preliminary results on Co-Ti sample analysis are presented.

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Combining scanning probe microscopy and x-ray spectroscopy

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