Composition-structure-properties correlation in ferroelectric thin films

A. Sternberg; M. Tyunina; M. Kundzinsh; V. Zauls; M. Ozolinsh; K. Kundzinsh; I. Shorubalko; M. Kosec; L. Calzada; L. Pardo; M. Alguero; R. Kullmer; D. Bäuerle; J. Levoska; S. Leppävuori; T. Martoniemi

Composition-structure-properties correlation in ferroelectric thin films

A. Sternberg^*
, M. Tyunina
, M. Kundzinsh
, V. Zauls
, M. Ozolinsh
, K. Kundzinsh
, I. Shorubalko
, M. Kosec
, L. Calzada
, L. Pardo
, M. Alguero
, R. Kullmer
, D. Bäuerle
, J. Levoska
, S. Leppävuori
, T. Martoniemi

^*Šī darba korespondējošais autors

University of Latvia
J. Stefan Institute
ICMM CSIC
Johannes Kepler University Linz
University of Oulu

Zinātniskās darbības rezultāts: Devums žurnālam › Zinātniskais raksts (žurnālā) › koleģiāli recenzēts

3 Atsauces (Scopus)

Kopsavilkums

Dielectric, ferroelectric and piezoelectric characteristics in sol-gel derived and pulsed laser deposited (PLD) lead zirconate titanate (PZT), La modified lead titanate (PLT) and zirconate titanate (PLZT), and the pseudo-binary relaxor material PbMg_1/3Nb_2/3O₃-PbTiO₃ (PMNT) thin films are investigated; the results being analyzed with regard to composition-structure-properties relationships. Interferometric studies of piezoelectric response of the heterostructures were performed with respect to a DC electrical bias and AC measurement frequency. The asymmetry of piezoelectric coefficient (d₃₃) hysteresis and diminished values of d₃₃ were attributed to residual stress at the film-substrate interfaces and unrelaxed strain, characteristic in highly oriented thin films.

Oriģinālvaloda	Angļu
Lapas (no-līdz)	S1365-S1368
Žurnāls	Journal of the Korean Physical Society
Sējums	32
Izdevuma numurs	4 SUPPL.
Publikācijas statuss	Publicēts - 1998

Citi faili un saites

Saite uz publikāciju Scopus

Citēt šo

@article{bbb0413e99744c1685eaedd0eb1e13cc,

title = "Composition-structure-properties correlation in ferroelectric thin films",

abstract = "Dielectric, ferroelectric and piezoelectric characteristics in sol-gel derived and pulsed laser deposited (PLD) lead zirconate titanate (PZT), La modified lead titanate (PLT) and zirconate titanate (PLZT), and the pseudo-binary relaxor material PbMg1/3Nb2/3O3-PbTiO3 (PMNT) thin films are investigated; the results being analyzed with regard to composition-structure-properties relationships. Interferometric studies of piezoelectric response of the heterostructures were performed with respect to a DC electrical bias and AC measurement frequency. The asymmetry of piezoelectric coefficient (d33) hysteresis and diminished values of d33 were attributed to residual stress at the film-substrate interfaces and unrelaxed strain, characteristic in highly oriented thin films.",

author = "A. Sternberg and M. Tyunina and M. Kundzinsh and V. Zauls and M. Ozolinsh and K. Kundzinsh and I. Shorubalko and M. Kosec and L. Calzada and L. Pardo and M. Alguero and R. Kullmer and D. B{\"a}uerle and J. Levoska and S. Lepp{\"a}vuori and T. Martoniemi",

year = "1998",

language = "English",

volume = "32",

pages = "S1365--S1368",

journal = "Journal of the Korean Physical Society",

issn = "0374-4884",

publisher = "Korean Physical Society",

number = "4 SUPPL.",

}

TY - JOUR

T1 - Composition-structure-properties correlation in ferroelectric thin films

AU - Sternberg, A.

AU - Tyunina, M.

AU - Kundzinsh, M.

AU - Zauls, V.

AU - Ozolinsh, M.

AU - Kundzinsh, K.

AU - Shorubalko, I.

AU - Kosec, M.

AU - Calzada, L.

AU - Pardo, L.

AU - Alguero, M.

AU - Kullmer, R.

AU - Bäuerle, D.

AU - Levoska, J.

AU - Leppävuori, S.

AU - Martoniemi, T.

PY - 1998

Y1 - 1998

N2 - Dielectric, ferroelectric and piezoelectric characteristics in sol-gel derived and pulsed laser deposited (PLD) lead zirconate titanate (PZT), La modified lead titanate (PLT) and zirconate titanate (PLZT), and the pseudo-binary relaxor material PbMg1/3Nb2/3O3-PbTiO3 (PMNT) thin films are investigated; the results being analyzed with regard to composition-structure-properties relationships. Interferometric studies of piezoelectric response of the heterostructures were performed with respect to a DC electrical bias and AC measurement frequency. The asymmetry of piezoelectric coefficient (d33) hysteresis and diminished values of d33 were attributed to residual stress at the film-substrate interfaces and unrelaxed strain, characteristic in highly oriented thin films.

AB - Dielectric, ferroelectric and piezoelectric characteristics in sol-gel derived and pulsed laser deposited (PLD) lead zirconate titanate (PZT), La modified lead titanate (PLT) and zirconate titanate (PLZT), and the pseudo-binary relaxor material PbMg1/3Nb2/3O3-PbTiO3 (PMNT) thin films are investigated; the results being analyzed with regard to composition-structure-properties relationships. Interferometric studies of piezoelectric response of the heterostructures were performed with respect to a DC electrical bias and AC measurement frequency. The asymmetry of piezoelectric coefficient (d33) hysteresis and diminished values of d33 were attributed to residual stress at the film-substrate interfaces and unrelaxed strain, characteristic in highly oriented thin films.

UR - https://www.scopus.com/pages/publications/0032396716

M3 - Article

AN - SCOPUS:0032396716

SN - 0374-4884

VL - 32

SP - S1365-S1368

JO - Journal of the Korean Physical Society

JF - Journal of the Korean Physical Society

IS - 4 SUPPL.

ER -

Composition-structure-properties correlation in ferroelectric thin films

Kopsavilkums

Citi faili un saites

Nospiedums

Citēt šo