DEVELOPMENT OF LIQUID CRYSTAL LAYER THICKNESS AND REFRACTIVE INDEX MEASUREMENT METHODS FOR SCATTERING TYPE LIQUID CRYSTAL DISPLAYS

Ainārs Ozols; G. Mozolevskis; R. Zalubovskis; Mārtiņš Rutkis

doi:10.2478/lpts-2022-0031

DEVELOPMENT OF LIQUID CRYSTAL LAYER THICKNESS AND REFRACTIVE INDEX MEASUREMENT METHODS FOR SCATTERING TYPE LIQUID CRYSTAL DISPLAYS

Ainārs Ozols^*
, G. Mozolevskis
, R. Zalubovskis
, Mārtiņš Rutkis

^*Šī darba korespondējošais autors

EUROLCDS SIA
University of Latvia
Latvian Institute of Organic Synthesis

Zinātniskās darbības rezultāts: Devums žurnālam › Zinātniskais raksts (žurnālā) › koleģiāli recenzēts

Kopsavilkums

We report the measuring method of scattering type display liquid crystal layer thickness based on capacitance values suitable for inline production process control. The method is selected for its effectiveness and simplicity over spectroscopic methods as conventional methods for scattering type displays are not applicable. During the method approbation process, a novel diffuser liquid crystal mixture refractive index was determined based on liquid crystal layer thickness measurement data.

Oriģinālvaloda	Angļu
Lapas (no-līdz)	25-35
Lapu skaits	11
Žurnāls	Latvian Journal of Physics and Technical Sciences
Sējums	59
Izdevuma numurs	4
DOIs	https://doi.org/10.2478/lpts-2022-0031
Publikācijas statuss	Publicēts - 1 aug. 2022

OECD Zinātnes nozare

1.3 Fizika un astronomija

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10.2478/lpts-2022-0031

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title = "DEVELOPMENT OF LIQUID CRYSTAL LAYER THICKNESS AND REFRACTIVE INDEX MEASUREMENT METHODS FOR SCATTERING TYPE LIQUID CRYSTAL DISPLAYS",

abstract = "We report the measuring method of scattering type display liquid crystal layer thickness based on capacitance values suitable for inline production process control. The method is selected for its effectiveness and simplicity over spectroscopic methods as conventional methods for scattering type displays are not applicable. During the method approbation process, a novel diffuser liquid crystal mixture refractive index was determined based on liquid crystal layer thickness measurement data.",

keywords = "Cell gap, COMSOL, fast switching diffusers, LCD",

author = "Ainārs Ozols and G. Mozolevskis and R. Zalubovskis and Mārtiņ{\v s} Rutkis",

year = "2022",

month = aug,

day = "1",

doi = "10.2478/lpts-2022-0031",

language = "English",

volume = "59",

pages = "25--35",

journal = "Latvian Journal of Physics and Technical Sciences",

issn = "0868-8257",

publisher = "Institute of Physical Energetics (Latvia)",

number = "4",

}

DEVELOPMENT OF LIQUID CRYSTAL LAYER THICKNESS AND REFRACTIVE INDEX MEASUREMENT METHODS FOR SCATTERING TYPE LIQUID CRYSTAL DISPLAYS. / Ozols, Ainārs; Mozolevskis, G.; Zalubovskis, R. u.c.
(gadā): Latvian Journal of Physics and Technical Sciences, Sēj. 59, Nr. 4, 01.08.2022, lpp. 25-35.

Zinātniskās darbības rezultāts: Devums žurnālam › Zinātniskais raksts (žurnālā) › koleģiāli recenzēts

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T1 - DEVELOPMENT OF LIQUID CRYSTAL LAYER THICKNESS AND REFRACTIVE INDEX MEASUREMENT METHODS FOR SCATTERING TYPE LIQUID CRYSTAL DISPLAYS

AU - Ozols, Ainārs

AU - Mozolevskis, G.

AU - Zalubovskis, R.

AU - Rutkis, Mārtiņš

PY - 2022/8/1

Y1 - 2022/8/1

N2 - We report the measuring method of scattering type display liquid crystal layer thickness based on capacitance values suitable for inline production process control. The method is selected for its effectiveness and simplicity over spectroscopic methods as conventional methods for scattering type displays are not applicable. During the method approbation process, a novel diffuser liquid crystal mixture refractive index was determined based on liquid crystal layer thickness measurement data.

AB - We report the measuring method of scattering type display liquid crystal layer thickness based on capacitance values suitable for inline production process control. The method is selected for its effectiveness and simplicity over spectroscopic methods as conventional methods for scattering type displays are not applicable. During the method approbation process, a novel diffuser liquid crystal mixture refractive index was determined based on liquid crystal layer thickness measurement data.

KW - Cell gap

KW - COMSOL

KW - fast switching diffusers

KW - LCD

UR - https://www.sciendo.com/article/10.2478/lpts-2022-0031

UR - https://www.scopus.com/pages/publications/85138827472

U2 - 10.2478/lpts-2022-0031

DO - 10.2478/lpts-2022-0031

M3 - Article

SN - 0868-8257

VL - 59

SP - 25

EP - 35

JO - Latvian Journal of Physics and Technical Sciences

JF - Latvian Journal of Physics and Technical Sciences

IS - 4

ER -

DEVELOPMENT OF LIQUID CRYSTAL LAYER THICKNESS AND REFRACTIVE INDEX MEASUREMENT METHODS FOR SCATTERING TYPE LIQUID CRYSTAL DISPLAYS

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