Dielectric anomalies in relaxor ferroelectric thin films

M. Tyunina; J. Levoska; S. Leppävuori; V. Zauls; K. Kundzinsh; M. Kundzinsh

doi:10.1080/00150190211236

Dielectric anomalies in relaxor ferroelectric thin films

M. Tyunina^*
, J. Levoska
, S. Leppävuori
, V. Zauls
, K. Kundzinsh
, M. Kundzinsh

^*Šī darba korespondējošais autors

Latvijas Universitāte

University of Oulu
University of Latvia

Zinātniskās darbības rezultāts: Devums žurnālam › Zinātniskais raksts (žurnālā) › koleģiāli recenzēts

1 Atsauce (Scopus)

Kopsavilkums

Dielectric properties of epitaxial relaxor ferroelectric thin-film heterostructures were experimentally studied in a broad range of temperature, frequency, and amplitude of ac-field. Contribution of the film-electrode interfaces to the properties of the heterostructures was evaluated and the true properties of the films were reconstructed and analyzed. In the films, the Vögel-Fulcher relationship, deviation from Curie-Weiss behavior, temperature evolution of local order parameter, relaxation-time spectrum, and dielectric nonlinearity were found to be essentially similar to those in bulk relaxor ferroelectrics.

Oriģinālvaloda	Angļu
Lapas (no-līdz)	235-240
Lapu skaits	6
Žurnāls	Ferroelectrics
Sējums	270
DOIs	https://doi.org/10.1080/00150190211236
Publikācijas statuss	Publicēts - 1 janv. 2002

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title = "Dielectric anomalies in relaxor ferroelectric thin films",

abstract = "Dielectric properties of epitaxial relaxor ferroelectric thin-film heterostructures were experimentally studied in a broad range of temperature, frequency, and amplitude of ac-field. Contribution of the film-electrode interfaces to the properties of the heterostructures was evaluated and the true properties of the films were reconstructed and analyzed. In the films, the V{\"o}gel-Fulcher relationship, deviation from Curie-Weiss behavior, temperature evolution of local order parameter, relaxation-time spectrum, and dielectric nonlinearity were found to be essentially similar to those in bulk relaxor ferroelectrics.",

keywords = "Dielectric, Epitaxial thin films, Relaxor ferroelectric",

author = "M. Tyunina and J. Levoska and S. Lepp{\"a}vuori and V. Zauls and K. Kundzinsh and M. Kundzinsh",

year = "2002",

month = jan,

day = "1",

doi = "10.1080/00150190211236",

language = "English",

volume = "270",

pages = "235--240",

journal = "Ferroelectrics",

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TY - JOUR

T1 - Dielectric anomalies in relaxor ferroelectric thin films

AU - Tyunina, M.

AU - Levoska, J.

AU - Leppävuori, S.

AU - Zauls, V.

AU - Kundzinsh, K.

AU - Kundzinsh, M.

PY - 2002/1/1

Y1 - 2002/1/1

N2 - Dielectric properties of epitaxial relaxor ferroelectric thin-film heterostructures were experimentally studied in a broad range of temperature, frequency, and amplitude of ac-field. Contribution of the film-electrode interfaces to the properties of the heterostructures was evaluated and the true properties of the films were reconstructed and analyzed. In the films, the Vögel-Fulcher relationship, deviation from Curie-Weiss behavior, temperature evolution of local order parameter, relaxation-time spectrum, and dielectric nonlinearity were found to be essentially similar to those in bulk relaxor ferroelectrics.

AB - Dielectric properties of epitaxial relaxor ferroelectric thin-film heterostructures were experimentally studied in a broad range of temperature, frequency, and amplitude of ac-field. Contribution of the film-electrode interfaces to the properties of the heterostructures was evaluated and the true properties of the films were reconstructed and analyzed. In the films, the Vögel-Fulcher relationship, deviation from Curie-Weiss behavior, temperature evolution of local order parameter, relaxation-time spectrum, and dielectric nonlinearity were found to be essentially similar to those in bulk relaxor ferroelectrics.

KW - Dielectric

KW - Epitaxial thin films

KW - Relaxor ferroelectric

UR - https://www.scopus.com/pages/publications/33746279100

U2 - 10.1080/00150190211236

DO - 10.1080/00150190211236

M3 - Article

AN - SCOPUS:33746279100

SN - 0015-0193

VL - 270

SP - 235

EP - 240

JO - Ferroelectrics

JF - Ferroelectrics

ER -

Dielectric anomalies in relaxor ferroelectric thin films

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