Effect of composition on the physical properties at nanoscale of PZT thin films

E. C. Lima; E. B. Araújo; I. K. Bdikin; A. L. Kholkin

doi:10.1080/00150193.2014.894391

Effect of composition on the physical properties at nanoscale of PZT thin films

E. C. Lima
, E. B. Araújo^*
, I. K. Bdikin
, A. L. Kholkin

^*Šī darba korespondējošais autors

Universidade Federal do Tocantins
Universidade Estadual Paulista Júlio de Mesquita Filho
University of Aveiro

Zinātniskās darbības rezultāts: Devums žurnālam › Zinātniskais raksts (žurnālā) › koleģiāli recenzēts

3 Atsauces (Scopus)

Kopsavilkums

PbZr_1?xTi_xO₃ (PZT) thin films (x = 0.46, 0.47, 0.48, 0.49, and 0.50) were deposited on Pt/TiO₂/SiO ₂/Si substrates using a polymeric chemical method to study the effects of the composition on the macroscopic electrical and local piezoelectric properties. Both measurements demonstrate the existence of a self-polarization effect in all studied PZT films. The measurements were discussed in terms of the contribution of the Schottky barriers to the self-polarization effect. It is shown that both Schottky barrier effect and mechanical coupling near the film-substrate interface are not the dominant mechanisms responsible for the observed phenomena.. © 2014

Oriģinālvaloda	Angļu
Lapas (no-līdz)	106-114
Lapu skaits	9
Žurnāls	Ferroelectrics
Sējums	465
Izdevuma numurs	1
DOIs	https://doi.org/10.1080/00150193.2014.894391
Publikācijas statuss	Publicēts - 11 jūn. 2014
Ārēji publicēts	Jā

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title = "Effect of composition on the physical properties at nanoscale of PZT thin films",

abstract = "PbZr1?xTixO3 (PZT) thin films (x = 0.46, 0.47, 0.48, 0.49, and 0.50) were deposited on Pt/TiO2/SiO 2/Si substrates using a polymeric chemical method to study the effects of the composition on the macroscopic electrical and local piezoelectric properties. Both measurements demonstrate the existence of a self-polarization effect in all studied PZT films. The measurements were discussed in terms of the contribution of the Schottky barriers to the self-polarization effect. It is shown that both Schottky barrier effect and mechanical coupling near the film-substrate interface are not the dominant mechanisms responsible for the observed phenomena.. {\textcopyright} 2014",

keywords = "Piezoelectric, piezoresponse, self-polarization",

author = "Lima, \{E. C.\} and Ara{\'u}jo, \{E. B.\} and Bdikin, \{I. K.\} and Kholkin, \{A. L.\}",

year = "2014",

month = jun,

day = "11",

doi = "10.1080/00150193.2014.894391",

language = "English",

volume = "465",

pages = "106--114",

journal = "Ferroelectrics",

issn = "0015-0193",

publisher = "Taylor and Francis Ltd.",

number = "1",

}

TY - JOUR

T1 - Effect of composition on the physical properties at nanoscale of PZT thin films

AU - Lima, E. C.

AU - Araújo, E. B.

AU - Bdikin, I. K.

AU - Kholkin, A. L.

PY - 2014/6/11

Y1 - 2014/6/11

N2 - PbZr1?xTixO3 (PZT) thin films (x = 0.46, 0.47, 0.48, 0.49, and 0.50) were deposited on Pt/TiO2/SiO 2/Si substrates using a polymeric chemical method to study the effects of the composition on the macroscopic electrical and local piezoelectric properties. Both measurements demonstrate the existence of a self-polarization effect in all studied PZT films. The measurements were discussed in terms of the contribution of the Schottky barriers to the self-polarization effect. It is shown that both Schottky barrier effect and mechanical coupling near the film-substrate interface are not the dominant mechanisms responsible for the observed phenomena.. © 2014

AB - PbZr1?xTixO3 (PZT) thin films (x = 0.46, 0.47, 0.48, 0.49, and 0.50) were deposited on Pt/TiO2/SiO 2/Si substrates using a polymeric chemical method to study the effects of the composition on the macroscopic electrical and local piezoelectric properties. Both measurements demonstrate the existence of a self-polarization effect in all studied PZT films. The measurements were discussed in terms of the contribution of the Schottky barriers to the self-polarization effect. It is shown that both Schottky barrier effect and mechanical coupling near the film-substrate interface are not the dominant mechanisms responsible for the observed phenomena.. © 2014

KW - Piezoelectric

KW - piezoresponse

KW - self-polarization

UR - https://www.scopus.com/pages/publications/84899853331

U2 - 10.1080/00150193.2014.894391

DO - 10.1080/00150193.2014.894391

M3 - Article

AN - SCOPUS:84899853331

SN - 0015-0193

VL - 465

SP - 106

EP - 114

JO - Ferroelectrics

JF - Ferroelectrics

IS - 1

ER -

Effect of composition on the physical properties at nanoscale of PZT thin films

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