EPR spectrum angular dependences in LiYF4 crystal

A. Antuzevics; A. Fedotovs; U. Rogulis

doi:10.2478/v10047-012-0034-0

EPR spectrum angular dependences in LiYF4 crystal

Spektroskopijas laboratorija, Cietvielu fizikas institūts

Zinātniskās darbības rezultāts: Devums žurnālam › Zinātniskais raksts (žurnālā) › koleģiāli recenzēts

2 Atsauces (Scopus)

Kopsavilkums

Electron paramagnetic resonance (EPR) measurements have been made for two perpendicular planes in a LiYF₄ crystal before and after x-ray irradiation at room temperature. Analysis of the EPR spectrum angular dependence shows the presence of two defects - an impurity ion, which was embedded during the crystal growth process, and an x-ray induced defect with the g-factor of approx. 2.0. Spectral parameters and possible defect models are discussed.

Oriģinālvaloda	Angļu
Lapas (no-līdz)	49-54
Lapu skaits	6
Žurnāls	Latvian Journal of Physics and Technical Sciences
Sējums	49
Izdevuma numurs	6-I
DOIs	https://doi.org/10.2478/v10047-012-0034-0
Publikācijas statuss	Publicēts - dec. 2012

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1.3 Fizika un astronomija

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title = "EPR spectrum angular dependences in LiYF4 crystal",

abstract = "Electron paramagnetic resonance (EPR) measurements have been made for two perpendicular planes in a LiYF4 crystal before and after x-ray irradiation at room temperature. Analysis of the EPR spectrum angular dependence shows the presence of two defects - an impurity ion, which was embedded during the crystal growth process, and an x-ray induced defect with the g-factor of approx. 2.0. Spectral parameters and possible defect models are discussed.",

keywords = "EPR spectrum, LiYF crystal",

author = "A. Antuzevics and A. Fedotovs and U. Rogulis",

year = "2012",

month = dec,

doi = "10.2478/v10047-012-0034-0",

language = "English",

volume = "49",

pages = "49--54",

journal = "Latvian Journal of Physics and Technical Sciences",

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T1 - EPR spectrum angular dependences in LiYF4 crystal

AU - Antuzevics, A.

AU - Fedotovs, A.

AU - Rogulis, U.

PY - 2012/12

Y1 - 2012/12

N2 - Electron paramagnetic resonance (EPR) measurements have been made for two perpendicular planes in a LiYF4 crystal before and after x-ray irradiation at room temperature. Analysis of the EPR spectrum angular dependence shows the presence of two defects - an impurity ion, which was embedded during the crystal growth process, and an x-ray induced defect with the g-factor of approx. 2.0. Spectral parameters and possible defect models are discussed.

AB - Electron paramagnetic resonance (EPR) measurements have been made for two perpendicular planes in a LiYF4 crystal before and after x-ray irradiation at room temperature. Analysis of the EPR spectrum angular dependence shows the presence of two defects - an impurity ion, which was embedded during the crystal growth process, and an x-ray induced defect with the g-factor of approx. 2.0. Spectral parameters and possible defect models are discussed.

KW - EPR spectrum

KW - LiYF crystal

UR - https://www.scopus.com/pages/publications/84878308531

U2 - 10.2478/v10047-012-0034-0

DO - 10.2478/v10047-012-0034-0

M3 - Article

AN - SCOPUS:84878308531

SN - 0868-8257

VL - 49

SP - 49

EP - 54

JO - Latvian Journal of Physics and Technical Sciences

JF - Latvian Journal of Physics and Technical Sciences

IS - 6-I

ER -

EPR spectrum angular dependences in LiYF4 crystal

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