Kopsavilkums
An attempt is made to interpret the current-voltage characteristic of a p-Si-n-3C-SiC heterostructure in terms of the excess-tunneling mechanism. The space charge region width W and tunneling length λ are estimated. It is shown that W ≫ λ and, despite this, that the current transport through the heterostructure obeys the tunneling mechanism. The characteristic tunneling energy ε = 57 meV, temperature coefficient of the saturation current, and the barrier thinness factor are found.
| Oriģinālvaloda | Angļu |
|---|---|
| Lapas (no-līdz) | 77-79 |
| Lapu skaits | 3 |
| Žurnāls | Semiconductors |
| Sējums | 35 |
| Izdevuma numurs | 1 |
| DOIs | |
| Publikācijas statuss | Publicēts - janv. 2001 |
| Ārēji publicēts | Jā |
Nospiedums
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