Frequency-dependent electromechanical response in ferroelectric materials measured via piezoresponse force microscopy

I. K. Bdikin; V. V. Shvartsman; S. H. Kim; J. Manuel Herrero; A. L. Kholkin

doi:10.1557/proc-784-c11.3

Frequency-dependent electromechanical response in ferroelectric materials measured via piezoresponse force microscopy

I. K. Bdikin^*
, V. V. Shvartsman
, S. H. Kim
, J. Manuel Herrero
, A. L. Kholkin

^*Šī darba korespondējošais autors

University of Aveiro
INOSTEK Inc.
ICMM CSIC

Zinātniskās darbības rezultāts: Devums žurnālam › Konferences zinātniskais raksts › koleģiāli recenzēts

6 Atsauces (Scopus)

Kopsavilkums

Local piezoelectric signal is measured via Piezoresponse Force Microscopy (PFM) in PbZr_0.3Ti_0.7O₃ films and PbZr _1/3Nb_2/3O₃-0.045PbTiO₃ single crystals. It is observed that the amplitude of piezoelectric response is almost independent on frequency for vertical (out of plane) signal and strongly decreases with increasing frequency in the range 10-100 kHz for lateral (in-plane) response. Moreover, the in-plane piezoelectric contrast is reversed when the measurements are done at high enough frequency (phase shift exceeds 90°). As a result, the inplane polarization direction can be misinterpreted if the driving frequency exceeds certain level. For the explanation of observed effect a simple model is proposed that takes into account a possible slip between the conductive PFM tip and moving piezoelectric surface. The implications of the observed frequency-dependent contrast for the domain imaging in ferroelectric materials are discussed.

Oriģinālvaloda	Angļu
Lapas (no-līdz)	83-88
Lapu skaits	6
Žurnāls	Materials Research Society Symposium - Proceedings
Sējums	784
DOIs	https://doi.org/10.1557/proc-784-c11.3
Publikācijas statuss	Publicēts - 2003
Ārēji publicēts	Jā
Pasākums	Ferroelectric Thin Films XII - Boston, MA, Amerikas Savienotās Valstis Ilgums: 1 dec. 2003 → 4 dec. 2003

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@article{7b086594cf8f428fabea17431895c8cb,

title = "Frequency-dependent electromechanical response in ferroelectric materials measured via piezoresponse force microscopy",

abstract = "Local piezoelectric signal is measured via Piezoresponse Force Microscopy (PFM) in PbZr0.3Ti0.7O3 films and PbZr 1/3Nb2/3O3-0.045PbTiO3 single crystals. It is observed that the amplitude of piezoelectric response is almost independent on frequency for vertical (out of plane) signal and strongly decreases with increasing frequency in the range 10-100 kHz for lateral (in-plane) response. Moreover, the in-plane piezoelectric contrast is reversed when the measurements are done at high enough frequency (phase shift exceeds 90°). As a result, the inplane polarization direction can be misinterpreted if the driving frequency exceeds certain level. For the explanation of observed effect a simple model is proposed that takes into account a possible slip between the conductive PFM tip and moving piezoelectric surface. The implications of the observed frequency-dependent contrast for the domain imaging in ferroelectric materials are discussed.",

author = "Bdikin, \{I. K.\} and Shvartsman, \{V. V.\} and Kim, \{S. H.\} and Herrero, \{J. Manuel\} and Kholkin, \{A. L.\}",

year = "2003",

doi = "10.1557/proc-784-c11.3",

language = "English",

volume = "784",

pages = "83--88",

journal = "Materials Research Society Symposium - Proceedings",

issn = "0272-9172",

publisher = "Springer Nature",

note = "Ferroelectric Thin Films XII ; Conference date: 01-12-2003 Through 04-12-2003",

}

Frequency-dependent electromechanical response in ferroelectric materials measured via piezoresponse force microscopy. / Bdikin, I. K.; Shvartsman, V. V.; Kim, S. H. u.c.
(gadā): Materials Research Society Symposium - Proceedings, Sēj. 784, 2003, lpp. 83-88.

Zinātniskās darbības rezultāts: Devums žurnālam › Konferences zinātniskais raksts › koleģiāli recenzēts

TY - JOUR

T1 - Frequency-dependent electromechanical response in ferroelectric materials measured via piezoresponse force microscopy

AU - Bdikin, I. K.

AU - Shvartsman, V. V.

AU - Kim, S. H.

AU - Herrero, J. Manuel

AU - Kholkin, A. L.

PY - 2003

Y1 - 2003

N2 - Local piezoelectric signal is measured via Piezoresponse Force Microscopy (PFM) in PbZr0.3Ti0.7O3 films and PbZr 1/3Nb2/3O3-0.045PbTiO3 single crystals. It is observed that the amplitude of piezoelectric response is almost independent on frequency for vertical (out of plane) signal and strongly decreases with increasing frequency in the range 10-100 kHz for lateral (in-plane) response. Moreover, the in-plane piezoelectric contrast is reversed when the measurements are done at high enough frequency (phase shift exceeds 90°). As a result, the inplane polarization direction can be misinterpreted if the driving frequency exceeds certain level. For the explanation of observed effect a simple model is proposed that takes into account a possible slip between the conductive PFM tip and moving piezoelectric surface. The implications of the observed frequency-dependent contrast for the domain imaging in ferroelectric materials are discussed.

AB - Local piezoelectric signal is measured via Piezoresponse Force Microscopy (PFM) in PbZr0.3Ti0.7O3 films and PbZr 1/3Nb2/3O3-0.045PbTiO3 single crystals. It is observed that the amplitude of piezoelectric response is almost independent on frequency for vertical (out of plane) signal and strongly decreases with increasing frequency in the range 10-100 kHz for lateral (in-plane) response. Moreover, the in-plane piezoelectric contrast is reversed when the measurements are done at high enough frequency (phase shift exceeds 90°). As a result, the inplane polarization direction can be misinterpreted if the driving frequency exceeds certain level. For the explanation of observed effect a simple model is proposed that takes into account a possible slip between the conductive PFM tip and moving piezoelectric surface. The implications of the observed frequency-dependent contrast for the domain imaging in ferroelectric materials are discussed.

UR - https://www.scopus.com/pages/publications/2942640261

U2 - 10.1557/proc-784-c11.3

DO - 10.1557/proc-784-c11.3

M3 - Conference article

AN - SCOPUS:2942640261

SN - 0272-9172

VL - 784

SP - 83

EP - 88

JO - Materials Research Society Symposium - Proceedings

JF - Materials Research Society Symposium - Proceedings

T2 - Ferroelectric Thin Films XII

Y2 - 1 December 2003 through 4 December 2003

ER -

Frequency-dependent electromechanical response in ferroelectric materials measured via piezoresponse force microscopy

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