Impact of crystallisation processes on depth profile formation in sol-gel PbZr0·52Ti0·48O3 thin films

I. Aulika; S. Mergen; A. Bencan; Q. Zhang; A. Dejneka; M. Kosec; K. Kundzins; D. Demarchi; P. Civera

doi:10.1179/1743676112Y.0000000019

Impact of crystallisation processes on depth profile formation in sol-gel PbZr_0·52Ti_0·48O₃ thin films

I. Aulika^*
, S. Mergen
, A. Bencan
, Q. Zhang
, A. Dejneka
, M. Kosec
, K. Kundzins
, D. Demarchi
, P. Civera

^*Šī darba korespondējošais autors

Plāno kārtiņu laboratorija, Cietvielu fizikas institūts

Eltek Group
University of Melbourne
J. Stefan Institute
Cranfield University
Czech Academy of Sciences
Italian Institute of Technology
Polytechnic University of Turin

Zinātniskās darbības rezultāts: Devums žurnālam › Zinātniskais raksts (žurnālā) › koleģiāli recenzēts

2 Atsauces (Scopus)

Kopsavilkums

This study revealed the influence of crystallisation processes on the homogeneity of the sol-gel PbZr_0·52Ti _0·48O₃ thin films, allowing identification and further optimisation of thin film performance. Crystallisation processes determine the optical gradient appearance, irrespective of the chemical solvents used in this work. X-ray diffraction analysis showed that a refractive index gradient was apparent in the samples which had dominant (001)/(100) orientation and significant change of lattice parameters with thickness.

Oriģinālvaloda	Angļu
Lapas (no-līdz)	53-58
Lapu skaits	6
Žurnāls	Advances in Applied Ceramics
Sējums	112
Izdevuma numurs	1
DOIs	https://doi.org/10.1179/1743676112Y.0000000019
Publikācijas statuss	Publicēts - janv. 2013

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10.1179/1743676112Y.0000000019

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abstract = "This study revealed the influence of crystallisation processes on the homogeneity of the sol-gel PbZr0·52Ti 0·48O3 thin films, allowing identification and further optimisation of thin film performance. Crystallisation processes determine the optical gradient appearance, irrespective of the chemical solvents used in this work. X-ray diffraction analysis showed that a refractive index gradient was apparent in the samples which had dominant (001)/(100) orientation and significant change of lattice parameters with thickness.",

keywords = "Compositional and optical gradient, Crystallisation process, Depth profile, PZT, Sol-gel, Spectroscopic ellipsometry, Thin films, XRD",

author = "I. Aulika and S. Mergen and A. Bencan and Q. Zhang and A. Dejneka and M. Kosec and K. Kundzins and D. Demarchi and P. Civera",

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T1 - Impact of crystallisation processes on depth profile formation in sol-gel PbZr0·52Ti0·48O3 thin films

AU - Aulika, I.

AU - Mergen, S.

AU - Bencan, A.

AU - Zhang, Q.

AU - Dejneka, A.

AU - Kosec, M.

AU - Kundzins, K.

AU - Demarchi, D.

AU - Civera, P.

PY - 2013/1

Y1 - 2013/1

N2 - This study revealed the influence of crystallisation processes on the homogeneity of the sol-gel PbZr0·52Ti 0·48O3 thin films, allowing identification and further optimisation of thin film performance. Crystallisation processes determine the optical gradient appearance, irrespective of the chemical solvents used in this work. X-ray diffraction analysis showed that a refractive index gradient was apparent in the samples which had dominant (001)/(100) orientation and significant change of lattice parameters with thickness.

AB - This study revealed the influence of crystallisation processes on the homogeneity of the sol-gel PbZr0·52Ti 0·48O3 thin films, allowing identification and further optimisation of thin film performance. Crystallisation processes determine the optical gradient appearance, irrespective of the chemical solvents used in this work. X-ray diffraction analysis showed that a refractive index gradient was apparent in the samples which had dominant (001)/(100) orientation and significant change of lattice parameters with thickness.

KW - Compositional and optical gradient

KW - Crystallisation process

KW - Depth profile

KW - PZT

KW - Sol-gel

KW - Spectroscopic ellipsometry

KW - Thin films

KW - XRD

UR - https://www.scopus.com/pages/publications/84874081367

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SN - 1743-6753

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EP - 58

JO - Advances in Applied Ceramics

JF - Advances in Applied Ceramics

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