TY - GEN
T1 - Investigation of Photoluminescence and Raman Emission of Porous Gallium Phosphide
AU - Suchikova, Yana
AU - Kovachov, Sergii
AU - Karipbaev, Zhakyp
AU - Zhydachevskyy, Yaroslav
AU - Bohdanov, Ihor
AU - Popovs, Anatolijs
N1 - Publisher Copyright:
© 2024 IEEE.
PY - 2024
Y1 - 2024
N2 - This article presents a study of porous gallium phosphode (GaP) utilizing photoluminescence (PL) and Raman spectroscopy, followed by its synthesis by electrochemical etching. The investigation identifies a blue shift in the PL peak, indicative of quantum confinement phenomena, and spectral confirmation of structural integrity through Raman analysis. Deconvolution of the PL emission into Gaussian components further demarcates a complex defect structure. These results contribute significantly to the discussion on the impact of nanostructuring on semiconductor properties, providing a pathway to the refined application of GaP in optoelectronic device engineering.
AB - This article presents a study of porous gallium phosphode (GaP) utilizing photoluminescence (PL) and Raman spectroscopy, followed by its synthesis by electrochemical etching. The investigation identifies a blue shift in the PL peak, indicative of quantum confinement phenomena, and spectral confirmation of structural integrity through Raman analysis. Deconvolution of the PL emission into Gaussian components further demarcates a complex defect structure. These results contribute significantly to the discussion on the impact of nanostructuring on semiconductor properties, providing a pathway to the refined application of GaP in optoelectronic device engineering.
KW - Electrochemical Etching
KW - Gallium Phosphide
KW - Photoluminescence
KW - Raman
UR - https://ieeexplore.ieee.org/document/10756876
UR - https://www.scopus.com/pages/publications/85212471467
U2 - 10.1109/ELNANO63394.2024.10756876
DO - 10.1109/ELNANO63394.2024.10756876
M3 - Conference paper
SN - 9798350368178
T3 - Proceedings - IEEE International Conference on Electronics and Nanotechnology, ELNANO
SP - 227
EP - 230
BT - 2024 IEEE 42nd International Conference on Electronics and Nanotechnology, ELNANO 2024 - Proceedings
ER -