TY - JOUR
T1 - Ion temperature spectroscopic measurements in high rotation discharges by means of X-ray diagnostic at JET
AU - Avotiņa, Līga
AU - Baumane, Larisa
AU - Haļitovs, Mihails
AU - Kalniņa, Patrīcija
AU - Ķizāne, Gunta
AU - Lagzdiņa, Elza
AU - Leščinskis, Andris
AU - Pajuste, Elīna
AU - Šusts, Toms Elvijs
AU - Teimane, Anete Stīne
AU - Vītiņš, Aigars
AU - Zabolockis, Rūdolfs Jānis
AU - Zariņš, Artūrs
AU - Contributors, JET
N1 - Publisher Copyright:
© 2022 IOP Publishing Ltd and Sissa Medialab.
PY - 2022/7/1
Y1 - 2022/7/1
N2 - Measurement of the X-ray spectra of the He-like Ni ions (Ni26+) and their dielectronic satellites (Ni25+, Ni24+, and Ni23+) plays a crucial role in determination of electronic and ion temperature of plasma in the JET device. Because n ≥ 3 satellites of Ni25+ overlap with resonance line of Ni26+, it is important to reconstruct the structure of these satellites reliably. It is especially important in the cases when plasma rotation is high which may result in an additional broadening of the resonance line. This work is an attempt to identify possible causes of the additional broadening of the resonance line due to the effect of overlapping the dielectronic satellites with the resonance line of Ni26+ and the effect of toroidal plasma rotation shear.
AB - Measurement of the X-ray spectra of the He-like Ni ions (Ni26+) and their dielectronic satellites (Ni25+, Ni24+, and Ni23+) plays a crucial role in determination of electronic and ion temperature of plasma in the JET device. Because n ≥ 3 satellites of Ni25+ overlap with resonance line of Ni26+, it is important to reconstruct the structure of these satellites reliably. It is especially important in the cases when plasma rotation is high which may result in an additional broadening of the resonance line. This work is an attempt to identify possible causes of the additional broadening of the resonance line due to the effect of overlapping the dielectronic satellites with the resonance line of Ni26+ and the effect of toroidal plasma rotation shear.
KW - Plasma diagnostics - interferometry, spectroscopy and imaging
KW - Simulation methods and programs
KW - X-ray fluorescence (XRF) systems
UR - https://iopscience.iop.org/article/10.1088/1748-0221/17/07/C07008
UR - https://www.scopus.com/pages/publications/85134401581
U2 - 10.1088/1748-0221/17/07/C07008
DO - 10.1088/1748-0221/17/07/C07008
M3 - Article
SN - 1748-0221
VL - 17
JO - Journal of Instrumentation
JF - Journal of Instrumentation
IS - 7
M1 - C07008
ER -