TY - GEN
T1 - Local electromechanical properties of ferroelectric materials for piezoelectric applications
AU - Kholkin, A. L.
AU - Bdikin, I. K.
AU - Shvartsman, V. V.
AU - Orlova, A.
AU - Kiselev, D.
AU - Bogomolov, A. A.
AU - Kim, S. H.
PY - 2004
Y1 - 2004
N2 - Local electromechanical characterization is becoming prerequisite for the development of ferroelectric-based piezoelectric devices including multilayer actuators, micromotors, piezoelectric filters and, especially, microelectromechanical systems (MEMS), which combine piezoelectric elements and control electronics on the same chip. In this work, we present the results of local electromechanical characterization of several important ferroelectric materials including Pb(Zr.Ti)O3 (PZT) and (Pb,La)(Zr,Ti)O3 (PLZT) in both thin film and ceramic form. Local piezoelectric hysteresis measurements are performed by the piezoelectric force microscopy (PFM) that detects small electric field-induced deformation on the nanoscale, e. g., within the single grain of a polycrystalline material. A number of novel phenomena is observed with increasing dc bias voltage including the jump of ferroelectric domain wall to the grain boundary, the "fingerlike" instability of domain wall, and the local phase transition into ferroelectric phase.
AB - Local electromechanical characterization is becoming prerequisite for the development of ferroelectric-based piezoelectric devices including multilayer actuators, micromotors, piezoelectric filters and, especially, microelectromechanical systems (MEMS), which combine piezoelectric elements and control electronics on the same chip. In this work, we present the results of local electromechanical characterization of several important ferroelectric materials including Pb(Zr.Ti)O3 (PZT) and (Pb,La)(Zr,Ti)O3 (PLZT) in both thin film and ceramic form. Local piezoelectric hysteresis measurements are performed by the piezoelectric force microscopy (PFM) that detects small electric field-induced deformation on the nanoscale, e. g., within the single grain of a polycrystalline material. A number of novel phenomena is observed with increasing dc bias voltage including the jump of ferroelectric domain wall to the grain boundary, the "fingerlike" instability of domain wall, and the local phase transition into ferroelectric phase.
UR - https://www.scopus.com/pages/publications/33846324195
U2 - 10.1557/proc-838-o7.6
DO - 10.1557/proc-838-o7.6
M3 - Conference paper
AN - SCOPUS:33846324195
SN - 1558997865
SN - 9781558997868
T3 - Materials Research Society Symposium Proceedings
SP - 80
EP - 85
BT - Scanning-Probe and Other Novel Microscopies of Local Phenomena in Nanostructured Materials
PB - Materials Research Society
T2 - 2004 MRS Fall Meeting
Y2 - 29 November 2004 through 3 December 2004
ER -