Phase-sensitive near-field imaging of metal nanoparticles

J. Prikulis; H. Xu; L. Gunnarsson; M. Käll; H. Olin

doi:10.1063/1.1516249

Phase-sensitive near-field imaging of metal nanoparticles

J. Prikulis^*
, H. Xu
, L. Gunnarsson
, M. Käll
, H. Olin

^*Šī darba korespondējošais autors

Chalmers University of Technology

Zinātniskās darbības rezultāts: Devums žurnālam › Zinātniskais raksts (žurnālā) › koleģiāli recenzēts

45 Atsauces (Scopus)

Kopsavilkums

We report on the near-field imaging of silver nanoparticles using an aperture-type near-field microscope operated in illumination mode. The nanoparticles are imaged as interference patterns, due to far-field superposition of the optical fields emitted from the tip and elastically scattered from localized surface plasmons (SP). Aperture-type probe can thus be used to obtain information on the phase shift associated with localized SP coupling at the illumination wavelength.

Oriģinālvaloda	Angļu
Lapas (no-līdz)	6211-6214
Lapu skaits	4
Žurnāls	Journal of Applied Physics
Sējums	92
Izdevuma numurs	10
DOIs	https://doi.org/10.1063/1.1516249
Publikācijas statuss	Publicēts - 15 nov. 2002
Ārēji publicēts	Jā

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abstract = "We report on the near-field imaging of silver nanoparticles using an aperture-type near-field microscope operated in illumination mode. The nanoparticles are imaged as interference patterns, due to far-field superposition of the optical fields emitted from the tip and elastically scattered from localized surface plasmons (SP). Aperture-type probe can thus be used to obtain information on the phase shift associated with localized SP coupling at the illumination wavelength.",

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N2 - We report on the near-field imaging of silver nanoparticles using an aperture-type near-field microscope operated in illumination mode. The nanoparticles are imaged as interference patterns, due to far-field superposition of the optical fields emitted from the tip and elastically scattered from localized surface plasmons (SP). Aperture-type probe can thus be used to obtain information on the phase shift associated with localized SP coupling at the illumination wavelength.

AB - We report on the near-field imaging of silver nanoparticles using an aperture-type near-field microscope operated in illumination mode. The nanoparticles are imaged as interference patterns, due to far-field superposition of the optical fields emitted from the tip and elastically scattered from localized surface plasmons (SP). Aperture-type probe can thus be used to obtain information on the phase shift associated with localized SP coupling at the illumination wavelength.

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Phase-sensitive near-field imaging of metal nanoparticles

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