Piezoelectric and dielectric aging in Pb(Zr,Ti)O3 thin films and bulk ceramics

A. L. Kholkin; A. K. Tagantsev; E. L. Colla; D. V. Taylor; N. Setter

doi:10.1080/10584589708015722

Piezoelectric and dielectric aging in Pb(Zr,Ti)O₃ thin films and bulk ceramics

A. L. Kholkin^*
, A. K. Tagantsev
, E. L. Colla
, D. V. Taylor
, N. Setter

^*Šī darba korespondējošais autors

Swiss Federal Institute of Technology Lausanne

Zinātniskās darbības rezultāts: Devums žurnālam › Zinātniskais raksts (žurnālā) › koleģiāli recenzēts

38 Atsauces (Scopus)

Kopsavilkums

Piezoelectric and dielectric aging was studied in Pb(Zr,Ti)O₃ (PZT) thin films and bulk ceramics. It was found that piezoelectric aging in thin films obeys the logarithmic time dependence with the relative aging rate much higher than that of the dielectric constant, while comparable aging rates of piezoelectric and dielectric constants were found in PZT ceramics. The origin of piezoelectric aging in PZT films was related to depolarization of the films rather than to suppression of the domain wall motion as was generally accepted for PZT ceramics.

Oriģinālvaloda	Angļu
Lapas (no-līdz)	317-324
Lapu skaits	8
Žurnāls	Integrated Ferroelectrics
Sējums	15
Izdevuma numurs	1-4
DOIs	https://doi.org/10.1080/10584589708015722
Publikācijas statuss	Publicēts - 1997
Ārēji publicēts	Jā

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AU - Taylor, D. V.

AU - Setter, N.

PY - 1997

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AB - Piezoelectric and dielectric aging was studied in Pb(Zr,Ti)O3 (PZT) thin films and bulk ceramics. It was found that piezoelectric aging in thin films obeys the logarithmic time dependence with the relative aging rate much higher than that of the dielectric constant, while comparable aging rates of piezoelectric and dielectric constants were found in PZT ceramics. The origin of piezoelectric aging in PZT films was related to depolarization of the films rather than to suppression of the domain wall motion as was generally accepted for PZT ceramics.

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