Quantification of Bonded Ni Atoms for Ni-MoS2 Metallic Contact through X-ray Photoemission Electron Microscopy

Vladimirs Pankratovs; Marko Huttula; Joanna Hoszowska; Jean-Claude Dousse; Faisal Zeeshan; Yuran Niu; Alexei Zakharov; Zhongjia Huang; Gang Wang; Sergei Posysaev; Olga Miroshnichenko; Matti Alatalo; Wei Cao; Xinying Shi

doi:10.1017/S1431927618014526

Quantification of Bonded Ni Atoms for Ni-MoS2 Metallic Contact through X-ray Photoemission Electron Microscopy

Vladimirs Pankratovs
, Marko Huttula
, Joanna Hoszowska
, Jean-Claude Dousse
, Faisal Zeeshan
, Yuran Niu
, Alexei Zakharov
, Zhongjia Huang
, Gang Wang
, Sergei Posysaev
, Olga Miroshnichenko
, Matti Alatalo
, Wei Cao
, Xinying Shi

LU Cietvielu fizikas institūts

Zinātniskās darbības rezultāts: Devums žurnālam › Konferences tēzes (žurnālā) › koleģiāli recenzēts

Oriģinālvaloda	Angļu
Lapas (no-līdz)	458-459
Žurnāls	Microscopy and Microanalysis.
Sējums	24
Izdevuma numurs	S2
DOIs	https://doi.org/10.1017/S1431927618014526
Publikācijas statuss	Publicēts - 2018

Piekļuve Dokumentiem

10.1017/S1431927618014526

Citēt šo

Pankratovs, V., Huttula, M., Hoszowska, J., Dousse, J.-C., Zeeshan, F., Niu, Y., Zakharov, A., Huang, Z., Wang, G., Posysaev, S., Miroshnichenko, O., Alatalo, M., Cao, W., & Shi, X. (2018). Quantification of Bonded Ni Atoms for Ni-MoS2 Metallic Contact through X-ray Photoemission Electron Microscopy. Microscopy and Microanalysis., 24(S2), 458-459. https://doi.org/10.1017/S1431927618014526

@article{807bb2826fdb413f9f72678655fe9f7f,

title = "Quantification of Bonded Ni Atoms for Ni-MoS2 Metallic Contact through X-ray Photoemission Electron Microscopy",

author = "Vladimirs Pankratovs and Marko Huttula and Joanna Hoszowska and Jean-Claude Dousse and Faisal Zeeshan and Yuran Niu and Alexei Zakharov and Zhongjia Huang and Gang Wang and Sergei Posysaev and Olga Miroshnichenko and Matti Alatalo and Wei Cao and Xinying Shi",

year = "2018",

doi = "10.1017/S1431927618014526",

language = "English",

volume = "24",

pages = "458--459",

journal = "Microscopy and Microanalysis.",

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Pankratovs, V, Huttula, M, Hoszowska, J, Dousse, J-C, Zeeshan, F, Niu, Y, Zakharov, A, Huang, Z, Wang, G, Posysaev, S, Miroshnichenko, O, Alatalo, M, Cao, W & Shi, X 2018, 'Quantification of Bonded Ni Atoms for Ni-MoS2 Metallic Contact through X-ray Photoemission Electron Microscopy', Microscopy and Microanalysis., sēj. 24, Nr. S2, lpp. 458-459. https://doi.org/10.1017/S1431927618014526

TY - JOUR

T1 - Quantification of Bonded Ni Atoms for Ni-MoS2 Metallic Contact through X-ray Photoemission Electron Microscopy

AU - Pankratovs, Vladimirs

AU - Huttula, Marko

AU - Hoszowska, Joanna

AU - Dousse, Jean-Claude

AU - Zeeshan, Faisal

AU - Niu, Yuran

AU - Zakharov, Alexei

AU - Huang, Zhongjia

AU - Wang, Gang

AU - Posysaev, Sergei

AU - Miroshnichenko, Olga

AU - Alatalo, Matti

AU - Cao, Wei

AU - Shi, Xinying

PY - 2018

Y1 - 2018

U2 - 10.1017/S1431927618014526

DO - 10.1017/S1431927618014526

M3 - Meeting abstract

VL - 24

SP - 458

EP - 459

JO - Microscopy and Microanalysis.

JF - Microscopy and Microanalysis.

IS - S2

ER -