Kopsavilkums
We have fabricated a Sn O2 - La0.7 Sr0.3 Mn O3 (LSMO) bilayer on different substrates: Si (001), Al2 O3 (0001), and LaAl O3 (LAO) (001), using a pulsed laser deposition system. X-Ray diffraction analysis shows a polycrystalline growth of both layers on Si and Al2 O3, while an oriented growth of LSMO on LAO. Transport characteristics on Si are nonlinear, while on Al2 O3 it is linear. A sample on LAO shows a steplike voltage response to low current values. The transport seen on Si has been envisaged in terms of Si-LSMO rectifying characteristics with Sn O2 as buffer.
| Oriģinālvaloda | Angļu |
|---|---|
| Raksta numurs | 142109 |
| Žurnāls | Applied Physics Letters |
| Sējums | 92 |
| Izdevuma numurs | 14 |
| DOIs | |
| Publikācijas statuss | Publicēts - 2008 |
| Ārēji publicēts | Jā |
Nospiedums
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